AMD SC3200 manual Test and Measurement Interface Signals

Models: SC3200

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Signal Definitions

32581C

3.4.18JTAG Interface Signals (Continued)

Signal Name

Ball No.

Type

Description

Mux

 

 

 

 

 

TRST#

E29

I

JTAG Test Reset. This signal has an internal weak pull-

---

 

 

 

up resistor.

 

 

 

 

For normal JTAG operation, this signal should be active

 

 

 

 

at power-up.

 

 

 

 

If the JTAG interface is not being used, this signal can be

 

 

 

 

tied low.

 

 

 

 

 

 

3.4.19Test and Measurement Interface Signals

Signal Name

Ball No.

Type

Description

Mux

 

 

 

 

 

GXCLK

V30

O

GX Clock. This signal is for internal testing only. For nor-

FP_VDD_ON+

 

 

 

mal operation either program as FP_VDD_ON or leave

TEST3

 

 

 

unconnected.

 

 

 

 

 

 

TEST3

V30

O

Internal Test Signal. This signal is used for internal test-

FP_VDD_ON+

 

 

 

ing only. For normal operation leave unconnected, unless

GXCLK

 

 

 

programmed as FP_VDD_ON.

 

 

 

 

 

 

TEST2

AJ1

O

Internal Test Signals. These signals are used for internal

PLL5B

 

 

 

testing only. For normal operation, leave unconnected

 

TEST1

AG4

O

PLL6B

unless programmed as one of their muxed options.

 

 

 

 

TEST0

AH3

O

PLL2B

 

 

 

 

 

 

GTEST

F30

I

Global Test. This signal is used for internal testing only.

---

 

 

 

For normal operation this signal should be pulled down

 

 

 

 

with 1.5 KΩ.

 

 

 

 

 

 

PLL6B

AG4

I/O

PLL6, PLL5 and PLL2 Bypass. These signals are used

TEST1

 

 

 

for internal testing only. For normal operation leave

 

PLL5B

AJ1

I/O

TEST2

unconnected.

 

 

 

 

PLL2B

AH3

I/O

TEST0

 

 

 

 

 

 

SDTEST5

D28

O

Memory Internal Test Signals. These signals are used

GPIO6+

 

 

 

for internal testing only. For normal operation, these sig-

DTR2#/BOUT2+

 

 

 

nals should be programmed as one of their muxed

IDE_IOR1#

 

 

 

options.

 

SDTEST4

C31

O

GPIO8+CTS2#+

 

 

 

 

 

IDE_DREQ1

 

 

 

 

 

SDTEST3

E28

O

 

SIN2

 

 

 

 

 

SDTEST2

C28

O

 

GPIO9+DCD2#+

 

 

 

 

IDE_IOW1#

 

 

 

 

 

SDTEST1

B29

O

 

GPIO10+DSR2#

 

 

 

 

+IDE_IORDY1

 

 

 

 

 

SDTEST0

C30

O

 

GPIO7+RTS2#+

 

 

 

 

IDE_DACK1#

 

 

 

 

 

TDP

D30

I/O

Thermal Diode Positive / Negative. These signals are

---

 

 

 

for internal testing only. For normal operation leave

 

TDN

D31

I/O

---

unconnected.

 

 

 

 

 

 

 

 

 

AMD Geode™ SC3200 Processor Data Book

67

Page 67
Image 67
AMD SC3200 manual Test and Measurement Interface Signals, PLL6, PLL5 and PLL2 Bypass. These signals are used