Signal Descriptions

This section contains the following subsections:

Overview of test points

JTAG on page A-36

USB debug port on page A-36

Trace connector pinout on page A-37

Embedded logic analyzer on page A-38

AHB monitor on page A-38

FPGA debug connector pinout on page A-40.

A.13.1 Overview of test points

The functions of the test points on the PB926EJ-S are summarized in Table A-13. For information about setting the frequency of the core clock and auxiliary clock see Clock architecture on page 3-35.

 

 

Table A-13 Test point functions

 

 

 

Test point

Signal

Function

 

 

 

TP1

VBATT

1.5V backup battery voltage for RTC

 

 

 

TP2

REFCLK32K

Output from the 32kHz oscillator module

 

 

 

TP3

XTALCLK

Buffered GLOBALCLK

 

 

 

TP4

OSCCLK0

Output from programmable oscillator 0

 

 

 

TP5

OSCCLK1

Output from programmable oscillator 4

 

 

 

TP6

GLOBALCLK

Global clock (the default source is XTALCLKDRV from the FPGA)

 

 

 

TP7

OSCCLK2

Output from programmable oscillator 2

 

 

 

TP8

OSCCLK3

Output from programmable oscillator 3

 

 

 

TP9

OSCCLK4

Output from programmable oscillator 4

 

 

 

TP10

REFCLK24MHZ

24MHz ICS307 reference

 

 

 

TP11

DXN

XC2V2000 test signal (for manufacturing use only)

 

 

 

TP12

DXP

XC2V2000 test signal (for manufacturing use only)

 

 

 

TP13

5V

5V power supply for ARM926EJ-S PXP Development Chip

 

 

emulation

 

 

 

TP14

GND

Ground. OV signal

 

 

 

A-34

Copyright © 2003-2010 ARM Limited. All rights reserved.

ARM DUI 0224I

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ARM ARM DUI 0224I manual This section contains the following subsections, Jtag on page A-36, Overview of test points