SILICON GATE MOS 8702A

A.C. CHARACTERISTICS

TA =00 C to +70°C, V =+5V ±5%, V = -9V ±5%, V =-9V ±5% unless otherwise noted

ccooGG

SYMBOL

Freq. tOH tAcc

tovGG t es

teo too tOHC

TEST

Repetition Rate

Previous read data val id

Address to output delay

Clocked VGG set up [2]

Chip select delay

Output delay from CS

Output deselect

Data out hold in clocked VGG mode (Note 1)

MINIMUM TYPICAL MAXIMUM UNIT

1 MHz

100 ns

1.3p.s

1.0JlS

400 ns

900 ns

400 ns

5JlS

Note 1. The output will remain valid for tOHe as long as clocked VGG is at Vee. An address change may occur as soon as the output is sensed (clocked VGG may still be at Vee). Data becomes invalid for the old address when clocked VGG is returned to VGG.

2. For this option please specify 8702AL

CAPACITANCE*

SYMBOL

TEST

MINIMUM TYPICAL

MAXIMUM

UNIT

 

CONDITIONS

C1N

Input Capacitance

8

15

pF

'1N= Vee }

All

COUT

Output Capacitance

10

15

pF

CS = Vce

unused pins

CVGG

VGG Capacitance

 

30

pF

VOUT

= Vee

are at A.C.

 

VGG

= Vce

ground

 

(Clocked VGG Mode)

 

 

 

 

 

 

~This parameter is periodically sampled and is not 100% tested.

B) Clocked VGG Operation

SWITCHING CHARACTERISTICS

Conditions of Test:

Input pulse amplitudes: 0 to 4V; t R ' t F ::; 50 ns .

Output load is 1 TTL gate; measurements made at output of TTL gate (tpD ~ 15 ns)

A) Constant VGG Operation

ADDRESS I

 

--XI

 

 

 

CYCLE TIME

I/F REO

V

I

 

 

 

){~10%

 

 

1H

 

 

 

 

V1l

I.....------------J, .......----

 

~ 90%

 

 

 

_ V1H

ill

 

t--toH--1

 

----I t cs

~

I

cs

I I

 

':

V1l

:

 

 

I

 

 

 

 

I

 

 

 

 

I

VOH 7-

 

 

I

DATA

l

 

 

,

OUT

V1H

--- f

 

10%

cs

 

 

 

 

 

V1l

 

I

 

 

 

 

VOH ---fe'

I

- too -

I

V

 

 

DATA

 

I

OUT

 

I

VOL

 

I

 

 

- l

teo f -

ADDRESS

~

CYCLE: TIME - 1 FREO

 

xlI

 

 

' -

 

~

 

VIHXI,0"lo

 

 

 

 

 

V I------------..J

 

 

 

. 90%

 

 

• •

 

1L

 

 

 

 

 

I~---

 

 

 

 

 

 

 

 

 

I

 

 

 

 

1

 

VIH

\11

 

1

 

 

 

'

 

 

I---~Ons_____':

Cs

V1L

\1--------11----------

 

 

 

 

I

 

 

 

GG

 

-II.- t

DV

:

 

 

 

 

"I

GG

/:

 

 

 

 

Vcc\~ :

J

 

\--

CLOCKED

I:

 

: (SEE NOTE 11

 

V

Vee;

 

 

 

 

r---- tACC ----i

-I ~. 'OHC

 

 

 

 

I

I

 

 

 

DATA

 

 

I

I

 

 

 

 

 

I

I

 

 

 

OUT

 

 

 

 

 

 

 

 

 

 

 

 

 

V

v:DESELECTIDN OF DATA OUTPUT IN DR·TlE OPERATION

 

,H

.A

 

 

 

 

 

ADDRESS

 

 

 

 

 

CS

V1L

1-----------------

V

'\

,,,r---;;......---7

 

 

 

I

 

 

I

 

 

 

 

I

NOTE 2

- ,

 

~~Ons

 

,H

 

 

 

 

 

 

 

V1L

I

 

 

 

 

I

 

 

~~t

 

 

 

 

 

 

 

 

tOD~

 

 

 

GG

 

VGG

 

I

 

 

 

L·'·';

 

DV

 

 

 

 

VCC,\':

 

 

 

 

CLOCKED

::

 

/

 

 

I I

 

 

 

 

 

VGG

I "tl ------ JI

 

 

I

 

 

I

 

~50ns

-

---:

 

 

I

 

 

 

 

 

DATA ~~~:

\

 

 

 

{'

 

 

: . - tACC --- \

 

 

 

..J

 

VOl~

 

 

 

 

NOTE 1: The output will remain valid tor tOHe as long as clocked VGG is at Vee. An address change may occur as soon as the output is sensed (clocked VGG may still be at Vee!. Data becomes invalid for the old address when clocked VGG is returned to VGG'

~OTE 2: It CS makes a transition from VI L to VIH while clocked VGG IS at VGG. then deselection of output occurs at too as shown in static operation with constant VGG.

5-39

Page 103
Image 103
Intel 8080 manual 1N= Vee, ~10%, = V ce, Switching Characteristics, Vcc\~

8080 specifications

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