Table 6.11 TolerANT Technology Electrical Characteristics for SE SCSI Signals

Symbol

Parameter

Min1

Max

Unit

Test Conditions

2

Output high voltage

2.0

VDD +0.3

V

IOH = 7 mA

VOH

VOL

Output low voltage

VSS

0.5

V

IOL = 48 mA

VIH

Input high voltage

2.0

VDD +0.3

V

VIL

Input low voltage

VSS 0.3

0.8

V

Referenced to VSS

VIK

Input clamp voltage

0.66

0.77

V

VDD = 4.75; II = 20 mA

VTH

Threshold, HIGH to LOW

1.0

1.2

V

VTL

Threshold, LOW to HIGH

1.4

1.6

V

VTH–VTL

Hysteresis

300

500

mV

2

Output high current

2.5

24

mA

VOH = 2.5 V

IOH

IOL

Output low current

100

200

mA

VOL = 0.5 V

2

Short-circuit output high current

625

mA

Output driving low, pin

IOSH

 

 

 

 

 

shorted to VDD supply3

IOSL

Short-circuit output low current

95

mA

Output driving high, pin

 

 

 

 

 

shorted to VSS supply

ILH

Input high leakage

20

A

0.5 < VDD < 5.25

 

 

 

 

 

VPIN = 2.7 V

ILL

Input low leakage

20

A

0.5 < VDD < 5.25

 

 

 

 

 

VPIN = 0.5 V

RI

Input resistance

20

M

SCSI pins

CP

Capacitance per pin

15

pF

PQFP

t 2

Rise time, 10% to 90%

4.0

18.5

ns

Figure 6.1

R

 

 

 

 

 

tF

Fall time, 90% to 10%

4.0

18.5

ns

Figure 6.1

dVH/dt

Slew rate, LOW to HIGH

0.15

0.50

V/ns

Figure 6.1

dVL/dt

Slew rate, HIGH to LOW

0.15

0.50

V/ns

Figure 6.1

ESD

Electrostatic discharge

2

KV

MIL-STD-883C; 3015-7

 

 

 

 

 

 

 

Latch-up

100

mA

 

 

 

 

 

 

 

Filter delay

20

30

ns

Figure 6.2

 

 

 

 

 

 

 

Ultra filter delay

10

15

ns

Figure 6.2

 

 

 

 

 

 

 

Extended filter delay

40

60

ns

Figure 6.2

 

 

 

 

 

 

1.These values are guaranteed by periodic characterization; they are not 100% tested on every device.

2.Active negation outputs only: Data, Parity, SREQ/, SACK/.

3.Single pin only; irreversible damage may occur if sustained for one second.

6-6

Electrical Specifications

Page 244
Image 244
LSI 53C875A technical manual Symbol Parameter Min1 Max Unit Test Conditions, Pqfp