6-6 Electrical Specifications
Table 6.11 TolerANT Technology Electrical Characteristics for SE SCSI Signals
Symbol Parameter Min1
1. These values are guaranteedby periodic characterization; they are not 100% tested on every
device.
Max Unit Test Conditions
VOH2
2. Active negation outputsonly: Data, Parity, SREQ/, SACK/.
Output high voltage 2.0 VDD +0. 3 V IOH =7mA
VOL Output low voltage VSS 0.5 V IOL=48mA
VIH Input high voltage 2.0 VDD +0.3 V
VIL Input low voltage VSS 0.3 0.8 V Referenced to VSS
VIK Input clamp voltage 0.66 0.77 V VDD =4.75;I
I=20 mA
VTH Threshold, HIGH to LOW 1.0 1.2 V
VTL Threshold, LOW to HIGH 1.4 1.6 V
VTH–VTL Hysteresis 300 500 mV
IOH2Output high current 2.5 24 mA VOH =2.5V
IOL Output low current 100 200 mA VOL =0.5V
IOSH2Short-circuit output high current 625 mA Outputdriving low, pin
shorted to VDD supply3
3. Single pin only; irreversibledamage may occur if sustained for one second.
IOSL Short-circuit output low current 95 mA Output driving high, pin
shorted to VSS supply
ILH Input high leakage 20 µA0.5 < VDD <5.25
VPIN =2.7V
ILL Input low leakage 20 µA0.5 < VDD <5.25
VPIN =0.5V
RIInput resistance 20 MSCSI pins
CPCapacitance per pin 15 pF PQFP
tR2Rise time, 10% to 90% 4.0 18.5 ns Figure 6.1
tFFall time,90% to 10% 4.0 18.5 ns Figure6.1
dVH/dt Slew rate, LOW to HIGH 0.15 0.50 V/ns Figure 6.1
dVL/dt Slew rate, HIGH to LOW 0.15 0.50 V/ns Figure 6.1
ESD Electrostatic discharge 2 KV MIL-STD-883C;3015-7
Latch-up 100 – mA
Filter delay 20 30 ns Figure6.2
Ultra filter delay 10 15 ns Figure 6.2
Extended filter delay 40 60 ns Figure 6.2