TolerANTTechnology 7-7

Table 7.12 TolerANT TechnologyElectrical Characteristics
Symbol Parameter Min Max Unit Test Conditions
VOH1
1. Active negation outputs only: Data, Parity,SREQ/, SACK/.
Output high voltage 2.5 3.5 V IOH = 2.5 mA
VOL Output low voltage 0.1 0.5 V IOL =48mA
VIH Input high voltage 2.0 7.0 V –
VIL Input low voltage −0.5 0.8 V Referenced to VSS
VIK Input clamp voltage −0.66 −0.77 V VDD = 4.75; II=−20 mA
VTH Threshold, HIGH to LOW 1.1 1.3 V –
VTL Threshold, LOW to HIGH 1.5 1.7 V –
VTH–VTL Hysteresis 200 400 mV –
IOH1Output high current 2.5 24 mA VOH= 2.5 V
IOL Output low current 100 200 mA VOL= 0.5 V
IOSH1Short-circuit output high current – 625 mA Output driving low, pin
shorted to VDD supply2
2. Single pin only; irreversible damage mayoccur if sustained for one second.
IOSL Short-circuit output low current – 95 mA Output driving high, pin
shorted to VSS supply
ILH Input high leakage – 10 µA−0.5 < VDD < 5.25
VPIN = 2.7 V
ILL Input low leakage – −10 µA−0.5 < VDD < 5.25
VPIN = 0.5 V
RIInput resistance 20 – MΩSCSI pins3
3. SCSI RESET pin has 10 kΩpull-up resistor.
Note: These values are guaranteed by periodic characterization; they are not 100% tested on every
device.
CPCapacitance per pin – 10 pF PQFP
tR1Rise time, 10% to 90% 9.7 18.5 ns Figure 7.1
tFFall time, 90% to 10% 5.2 14.7 ns Figure 7.1
dVH/dt Slew rate, LOW to HIGH 0.15 0.49 V/ns Figure 7.1
dVL/dt Slew rate, HIGH to LOW 0.19 0.67 V/ns Figure 7.1
ESD Electrostatic discharge 2 – kV MIL-STD-883C; 3015-7
Latch-up 100 – mA –
Filter delay 20 30 ns Figure 7.2
Extended filter delay 40 60 ns Figure 7.2