Chapter 8 Tutorial

Measurement Fundamentals

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Strain

GF

R0

 

DR

DMM Sensitivity

 

 

1 με

2.0

120Ω

 

0.24 mΩ

0.1 mΩ (0.4 με)

 

 

1 με

2.0

350Ω

 

0.70 mΩ

1.0 mΩ (1.4 με)

 

 

1 με

2.0

1000Ω

 

2.0 mΩ

1.0 mΩ (0.5 με)

 

 

 

 

 

 

 

 

 

 

ey1J w vsu uxy”” q””y”q” ty 9:A=6I vqy”qqu q squ°u ty”q

readings in “uE” (micro-strain) directly. The instrument will automatically add the micro (“u”) prefix based upon actual calculated values. W

”zz

M =

1

 

B =

1

GF x R

0

GF

 

 

 

 

 

 

The resistive element of a strain gage will produce a resistance change ΔR due to measured strain as well as changes in gage temperature. This will create an “apparent” strain change which is undesirable. A second gage of similar type can be used to detect temperature changes and thus remove this error source.

You should mount the second gage in close proximity and at 90° to the first gage, thus responding to local temperature changes but rejecting

strain changes. Subtracting measurements from the second gage will 8 remove any undesirable strain errors.

375

Page 371
Image 371
HP 34970A manual Strain DMM Sensitivity