Appendix A Electrical Characteristics
MC9S12XDP512 Data Sheet, Rev. 2.11
Freescale Semiconductor 935
A.2.3 ATD Accuracy

A.2.3.1 5-V Range

Table A-15 specifies the ATD conversion performance excluding any errors due to current injection, input

capacitance, and source resistance.

A.2.3.2 3.3-V Range

Table A-16 specifies the ATD conversion performance excluding any errors due to current injection, input

capacitance, and source resistance.

Table A-15. 5-V ATD Conversion Performance
Conditions are shown in Table A-4 unless otherwise noted
VREF = VRH–VRL = 5.12 V. Resulting to one 8-bit count = 20 mV and one 10-bit count = 5 mV
fATDCLK = 2.0 MHz
Num C Rating Symbol Min Typ Max Unit
1 P 10-bit resolution LSB 5 mV
2 P 10-bit differential nonlinearity DNL –1 1 Counts
3 P 10-bit integral nonlinearity INL –2.5 ±1.5 2.5 Counts
4 P 10-bit absolute error1
1These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE –3 ±2.0 3 Counts
5 P 8-bit resolution LSB 20 mV
6 P 8-bit differential nonlinearity DNL –0.5 0.5 Counts
7 P 8-bit integral nonlinearity INL –1.0 ±0.5 1.0 Counts
8 P 8-bit absolute error1AE –1.5 ±1.0 1.5 Counts
Table A-16. 3.3-V ATD Conversion Performance
Conditions are shown in Table A-4 unless otherwise noted
VREF = VRH–VRL = 3.328 V. Resulting to one 8-bit count = 13mV and one 10-bit count = 3.25 mV
fATDCLK = 2.0 MHz
Num C Rating Symbol Min Typ Max Unit
1 P 10-bit resolution LSB 3.25 mV
2 P 10-bit differential nonlinearity DNL –1.5 1.5 Counts
3 P 10-bit integral nonlinearity INL –3.5 ±1.5 3.5 Counts
4 P 10-bit absolute error1
1These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE –5 ±2.5 5 Counts
5 P 8-bit resolution LSB 13 mV
6 P 8-bit differential nonlinearity DNL –0.5 0.5 Counts
7 P 8-bit integral nonlinearity INL –1.5 ±1.0 1.5 Counts
8 P 8-bit absolute error1AE –2.0 ±1.5 2.0 Counts