Tektronix 071-0855-05 Internal Payload Structures , Test Patterns

Specifications
A-4 OTS9100 User Manual
NOTE: In intrusive through mode, any defect applied has immediate effect. Certain anomalies
have no effect unless overwrite is turned on for the anomaly byte. This applies to B1 BIP (B1), B2
BIP (B2), REI-L (M1), B3 BIP (B3), and REI-P (G1). Random Bit, Random SPE Bit, and payload
bit may always be applied.
NOTE: G1 may not be explicitly edited but the overwrite control must be set to allow REI-P
anomalies to be inserted in through mode.
Internal Payload Structures
In SONET mode, the signal can be multiplexed as (192) STS-1, (64) STS-3c, (16) STS-12c, (4)
STS-48c, or (1) STS-192c.
In SDH mode, the signal can be multiplexed as (192) VC-3, (64) VC-4, (16) VC-4-4c, (4) VC-4-
16c, or (1) VC-4-64c.
For STS-1 and VC-3, the stuff columns may be set to 0 or filled with payload. In SPE/VC3 Bulk
mode, columns 30 and 59 will be filled with payload. In SPE/VC3 Stuff mode, columns 30 and
59 will be filled with zero byte.
Active Channel
The active channel affects which payload is affected by the active controls, including the POH
edit. The active channel range is dependent upon the structure and is so limited. The user may
control the structure, the SPE/VC3 Stuff column control, and the test pattern for each active
channel.
Background Channel
The user may control structure, SPE/VC3 Stuff column control, and test pattern.
NOTE: The background structure can never be ST-192c or VC-4-64c as that would take up the
entire signal.
Test Patterns
The test patterns available include PN15, PN15 Inverted, PN23, PN23 Inverted (ITU-T 0.181),
PN31, PN31 Inverted, All zeros, All ones, Fixed 8-bit Data (user-editable).