TEST Subsystem
This section describes each command and query in the TEST subsystem. These commands are used to execute internal self tests. The TEST subsystem controls the parameters shown in Figure 3±9.
TEST
ALL? NUMBer RESults
Figure 3±9: TEST subsystem hierarchy
Table 3±19 lists all of the internal self tests of the IntelliFrame Mainframe.
Table 3±19: IntelliFrame Mainframeself test
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| Execution time |
| Included in | Invoked by |
Test number | Test name | (seconds) | Power on test | TEST? | TEST:NUMBer? |
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1000 | Fan Speed Control | 116 | No | Yes | Yes |
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1010 | ADC and DAC Control | < 1 | Yes | Yes | Yes |
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1100 | Front Panel Display Control Test 1 | 25 | No | No | Yes |
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1110 | Front Panel Display Control Test 2 | 36 | No | No | Yes |
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1120 | Front Panel Display Control Test 3 | 6 | No | No | Yes |
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A description of each self test is listed below:
HFan Speed Control test. This test varies the fan speed control and verifies that the fan speed changes accordingly.
HADC and DAC Control test. This test verifies the internal ADC and DAC circuitry.
HFront Panel Display Control Test 1. This test performs the following sequences:
a.Turns on all display pixels.
b.Turns off all display pixels.
c.Writes the character 8 to each display position.
d.Turns on all display pixels.
VX1410A & VX1420A IntelliFrame Mainframe Instruction Manual | 3±149 |