7.8.2Die Voltage Validation

Core voltage (VCC) overshoot events at the processor must meet the specifications in Table 7-15when measured across the VCC_SENSE and VSS_VCC_SENSE lands. Overshoot events that are < 10 ns in duration may be ignored. These measurements of processor die level overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.

Figure 7-5. Load Current Versus Time

Notes:

1.The peak current for any 5 second sample does not exceed Icc_max.

2.The average current for any 10 second sample does not exceed the Y value at 10 seconds.

3.The average current for any 20 second period or greater does not exceed Icc_tdc.

4.Turbo performance may be impacted by failing to meet durations specified in this graph. Ensure that the platform design can handle peak and average current based on the specification.

5.Processor or voltage regulator thermal protection circuitry should not trip for load currents greater than ICC_TDC.

6.Not 100% tested. Specified by design characterization.

7.8.2.1VCC Overshoot Specifications

The processor can tolerate short transient overshoot events where VCC exceeds the VID voltage when transitioning from a high-to-low current load condition. This overshoot cannot exceed VID + VOS_MAX (VOS_MAX is the maximum allowable overshoot above VID). These specifications apply to the processor die voltage as measured across the VCC_SENSE and VSS_VCC_SENSE lands.

Table 7-15. VCC Overshoot Specifications (Sheet 1 of 2)

Symbol

Parameter

Min

Max

Units

Figure

Notes

 

 

 

 

 

 

 

VOS_MAX

Magnitude of VCC overshoot above VID

 

65

mV

7-6

 

Intel® Xeon® Processor E5-1600/E5-2600/E5-4600 Product Families

175

Datasheet Volume One

 

Page 175
Image 175
Intel E5-1600, E5-4600 Die Voltage Validation, VCC Overshoot Specifications Sheet 1, Symbol Parameter Min Max Units