7.11.2

PLL Output Clocks

7–19

7.11.2.1

GCLK

7–19

7.11.2.2

Differential 21264/EV67 Clocks

7–19

7.11.2.3

Nominal Operating Frequency

7–19

7.11.2.4

Power-Up/Reset Clocking

7–20

8 Error Detection and Error Handling

 

8.1

Data Error Correction Code

8–2

 

8.2

Icache Data or Tag Parity Error

8–2

 

8.3

Dcache Tag Parity Error

8–2

 

8.4

Dcache Data Single-Bit Correctable ECC Error

8–3

 

8.4.1

Load Instruction

8–3

 

8.4.2

Store Instruction (Quadword or Smaller)

8–4

 

8.4.3

Dcache Victim Extracts

8–4

 

8.5

Dcache Store Second Error

8–4

 

8.6

Dcache Duplicate Tag Parity Error

8–4

 

8.7

Bcache Tag Parity Error

8–5

 

8.8

Bcache Data Single-Bit Correctable ECC Error

8–5

 

8.8.1

Icache Fill from Bcache

8–5

 

8.8.2

Dcache Fill from Bcache

8–6

 

8.8.3

Bcache Victim Read

8–6

 

8.8.3.1

Bcache Victim Read During a Dcache/Bcache Miss

8–6

 

8.8.3.2

Bcache Victim Read During an ECB Instruction

8–7

 

8.9

Memory/System Port Single-Bit Data Correctable ECC Error

8–7

 

8.9.1

Icache Fill from Memory

8–7

 

8.9.2

Dcache Fill from Memory

8–7

 

8.10

Bcache Data Single-Bit Correctable ECC Error on a Probe

8–8

 

8.11

Double-Bit Fill Errors

8–9

 

8.12

Error Case Summary

8–9

9

Electrical Data

 

 

9.1

Electrical Characteristics

9–1

 

9.2

DC Characteristics

9–2

 

9.3

Power Supply Sequencing and Avoiding Potential Failure Mechanisms

9–5

 

9.4

AC Characteristics

9–6

10

Thermal Management

 

 

10.1

Operating Temperature

10–1

 

10.2

Heat Sink Specifications

10–3

 

10.3

Thermal Design Considerations

10–7

11

Testability and Diagnostics

 

 

11.1

Test Pins

11–1

 

11.2

SROM/Serial Diagnostic Terminal Port

11–2

 

11.2.1

SROM Load Operation

11–2

 

11.2.2

Serial Terminal Port

11–2

 

11.3

IEEE 1149.1 Port

11–3

 

11.4

TestStat_H Pin

11–4

 

11.5

Power-UpSelf-Test and Initialization

11–5

 

11.5.1

Built-inSelf-Test

11–5

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Alpha 21264/EV67 Hardware Reference Manual

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Compaq EV67, 21264 Error Detection and Error Handling, Electrical Data, Thermal Management, Testability and Diagnostics