Table 10-5. TAM Tests versus Test Connectors (1 of 2)

Connector Manual Probe Troubleshooting Test Measured Signal Line,

 

A14J 15

Sweep

Generator

 

 

MS8

 

 

Span

Attenuator

DAC

MS7

 

 

Span

Attenuator

Switches

MS7

 

 

Sweep + Tune Mult Input Amp

MSl, OS1

 

 

Sweep + Tune Mult Input Switches

MSl, MS3

 

 

VCO Sweep Driver

 

MS6, OS1

 

A14J 16

FAV Generator

 

 

MS4

 

 

FAV Gen 0.5 V/GHz Output

MS5

 

 

YTF Offset DAC

 

 

MS6

 

 

YTF Gain and Offset Input

MS2

 

 

YTF Gain DAC

 

 

MS1

 

 

YTF

Drive

 

 

 

 

 

MS3

 

 

Band Switch Driver

 

MS8

 

Al4J17

Main Coil Course DAC

MS3

 

 

Main Coil Fine DAC

MS2

 

 

Main Coil DACs Output

MS5

 

 

YTO

Loop

Phase

Detector

MS1

 

 

Main Loop Error Volt DVR

MS4

 

 

Option

Drive

 

 

 

 

MS8

 

 

Option

Drive

Switch

MS7

 

 

Option

Drive

DAC

 

MS6

 

A14J18

f10 V

Reference

 

 

MSl, MS2

 

 

LODA Drive

 

 

 

 

MS5, MS6, MS7, MSE

 

A14J19

Main Coil Tune DAC

MS3

 

 

Sweep Generator DAC

MS4

 

 

Sweep Generator Switches

MS4

 

 

Second

Conv

PIN

Switch

MS8

 

 

Second

Conv

Mixer

Bias

MS1

 

 

Second

Conv

Drain

Bias

MS3

 

 

Second

Conv

Doubler Bias

MS4

 

 

Second

Conv

Driver

Bias

MS5

 

 

First

Mixer

Drive

Switch

MS7

 

 

First

Mixer

Drive

DAC

MS6

 

 

A145302

Revision

 

 

 

 

 

MS7

 

 

XFER Osc Bias

 

 

MS1

 

 

XFER Pretune

DAC

MS6

 

 

Offset

 

Osc

Bias

 

 

 

MS2

 

 

Offset

Pretune

DAC

 

MS8

 

 

Offset

 

Amp

Bias

 

 

MS5

Synthesizer Section lo-11