Table 10-5. TAM Tests versus Test Connectors (2 of 2)

Connector Manual Probe Troubleshooting Test Measured Signal Lines

 

A14J303 XFER Amp Bias

 

MS3

 

Main Amp Bias

 

 

MS4

 

Out Amp Bias

 

 

MS1

 

Main Osc Bias

 

 

MS2

 

Main Pretune DAC

 

MS7

 

Course Adj DAC

 

MS8

 

Fine Adj DAC

 

 

MS6

 

Span Multiplier DAC

 

MS5

 

A15J200 Positive 15 Volt Supply

 

MS1

 

Sampler

Drive Buffer Bias

MS2

 

Sampling Oscillator Bias

MS3

 

Offset Lock Drive Buffer

MS4

 

OFL Error Voltage

 

MS6

 

Phase Detector Bias Adjust

MS8

 

A15J400 Positive 15 Volt Supply

 

MS2

 

Offset Lock RF

Buffer

 

- MS4

 

IF AMP/Limiter

Bias

 

MS6

 

Offset Lock Loop Buffer D

MS7

 

Offset Lock Loop Buffer C

MS8

 

Sampler

Bias Test

 

MS3

 

A15J502 Positive 15 Volt Supply

 

MS2

 

Third LO Tune Voltage

 

MS3

 

Offset Lock Loop Buffer

MS4

 

600 MHz Oscillator Bias

MS5

 

Calibrator AGC Amp Bias

MS6

 

Calibrator Amp1

Adj

 

MS7

 

3rd LO Driver Amp

 

MSl, MS8

 

A15J602 Positive 15 Volt Supply

 

MS8

 

Flatness

Compensation

3

MS2

 

Flatness

Compensation

2

MS5

 

Flatness

Compensation

1

MS6

 

SIG ID Collector Bias

 

MS7

 

RF Gain Control Test

 

MSl, MS3

 

A15J901 R e v i s i o n

 

 

 

MS4, MS3

 

External

Mixer Switch

 

MSl, MS8

 

Signal ID Switch

 

 

MS5, MS6

 

Ten Volt

Reference

 

MS4

 

External

Mixer Bias

 

MS7

 

RF Gain Test

 

 

MS2

lo-12 Synthesizer Section