8-16
Cisco ONS 15454 Installation and Operations Guide
November 2001
Chapter8 Performance Monitoring
Performance Monitoring for Electrical Cards
UAS-L Near-End Line Unavailable Seconds (UAS-L) is a count of the seconds
when the line is unavailable. A line becomes unavailable when ten
consecutive seconds occur that qualify as SES-Ls, and the line continues
to be unavailable until ten consecutive seconds occur that do not qualify
as SES-Ls.
FC-L Near-End Line Failure Count (FC-L) is a count of the number of near -e nd
line failure events. A failure event begins when an AIS-L failure or a
lower-layer, traffic-related, near-end failure is decl ared. This failure e vent
ends when the failure is cleared. A failure event that begins in one period
and ends in another period is counted only in the p er iod wh er e i t be gin s .
Table8-4 Near-End SONET Path PMs for the EC1 Card
Parameter Definition
Note SONET path PMs will not count unless IPPM is enabled. For additional information, see the
“Enable Intermediate-Path Performance Monitoring” procedure on page7-25. The far-end
IPPM feature is not supported in Software R3.1. However, SONET path PMs can be monitored
by logging into the far-end node directly.
STS CV-P Near-End STS Path Coding Violations (CV-P) is a count of BIP errors
detected at the STS path layer (i.e., using the B3 byte). Up to eight BIP
errors can be detected per frame; each error increments the current CV-P
second register.
STS ES-P Near-End STS Path Errored Seconds (ES-P) is a count of the seconds
when at least one STS path BIP error was detected. STS ES-P can also be
caused by an AIS-P defect (or a lower-layer, traffic-related, near-end
defect) or an LOP-P defect.
STS FC-P Near-End STS Path Failure Counts (FC-P) is a count of the number of
near-end STS path failure events. A failure event begins when an AIS-P
failure, an LOP-P failure, a unequipped path (UNEQ-P) or a trace
identifier mismatch (TIM-P) failure is declared. A failure event also
begins if the STS PTE monitoring the path supports ERDI-P for that path.
The failure event ends when these failures are cleared.
STS SES-P Near-End STS Path Severely Errored Seconds (SES-P) is a count of the
seconds when K (2400) or more STS path BIP errors were detected. STS
SES-P can also be caused by an AIS-P defect (or a lower-layer,
traffic-related, near-end defect) or an LOP-P defect.
STS UAS-P Near-End STS Path Unavailable Seconds (UAS-P) is a count of the
seconds when the STS path was unavailable. An STS path becomes
unavailable when ten consecutive seconds occur that qualify as SES-Ps,
and it continues to be unavailable until ten consecutive seconds occur that
do not qualify as SES-Ps.
Table8-3 Near-End Line Layer PMs for the EC1 Card (continued)
Parameter Definition