Instrument BASIC

Agilent Technologies 8922M/S Instrument BASIC Overview

Programs That Use the TESTS Subsystem

The TESTS subsystem’s capabilities were designed to allow the operator to “pick and choose” the tests and parameters they need from a larger set, eliminating unnecessary tests and reducing test time. This is especially helpful when a very large program has been written containing several tests and a multitude of associated specifications, test parameters and frequencies.

Writing programs to run in this environment requires you to understand and adhere to the program structure and syntax required by the TESTS subsystem.

Programs That Do Not Use the TESTS Subsystem

If you have a common test routine that uses the same tests and parameters every time it is run, it may be easier to write your test program to run directly in the IBASIC computer without using the TESTS subsystem.

These programs are much like any stand-alone program, and development of these programs will not be covered by this chapter. All of the general information sections of this chapter can be applied to these types of IBASIC programs.

By writing tests that do not use the TESTS subsystem, you lose the ability to easily access and change the test order and associated parameters with the subsystem’s editing screens (although you can write your program to provide operator input during the test to change parameters).

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Agilent Technologies 8922M, S GSM manual Programs That Use the Tests Subsystem, Programs That Do Not Use the Tests Subsystem