ADTRAN 1200305L1 CIRCUIT STATUS > TEST > LAST RUN TIME, CIRCUIT STATUS > TEST > NEXT RUN TIME, CIRCUIT STATUS > TEST > LAST TEST STATUS, CIRCUIT STATUS > TEST > PASS : FAIL, CIRCUIT STATUS > TEST > TEST NOW

Section 4, User Interface Guide ATLAS 550 System Manual
252 © 2002 ADTRAN, Inc. 61200305L1-1F
CIRCUIT STATUS > TEST > LAST RUN TIME
Read security: 5
(Not visible until a circuit has been tested.) Displays the date and time of the last test call made through
this dedicated dial backup circuit.
CIRCUIT STATUS > TEST > NEXT RUN TIME
Read security: 5
(Not visible unless TEST CALL is configured for non-manual operation in the INTERFACE CONFIG for the
CIRCUIT BACKUP ENDPOINT.) Displays the date and time of the next schedule test call to be made through
this dedicated dial backup circuit.
CIRCUIT STATUS > TEST > LAST TEST STATUS
Read security: 5
Displays the status of the last test call made through this dedicated dial backup circuit. The following status
messages may display:
CIRCUIT STATUS > TEST > PASS : FAIL
Read security: 5
Displays the number of successful and unsuccessful test calls made through this dedicated dial backup
circuit.
CIRCUIT STATUS > TEST > TEST NOW
Write security: 5; Read security: 5
Press to initiate a test call on the dedicated dial backup circuit.
IDLE No current test call on this dedicated dial backup circuit
PASSED Passed last manual or scheduled test
FAILED Failed last manual or scheduled test