Section 4, User Interface Guide

ATLAS 550 System Manual

 

 

CIRCUIT STATUS > TEST > LAST RUN TIME

Read security: 5

(Not visible until a circuit has been tested.) Displays the date and time of the last test call made through this dedicated dial backup circuit.

CIRCUIT STATUS > TEST > NEXT RUN TIME

Read security: 5

(Not visible unless TEST CALL is configured for non-manual operation in the INTERFACE CONFIG for the CIRCUIT BACKUP ENDPOINT.) Displays the date and time of the next schedule test call to be made through this dedicated dial backup circuit.

CIRCUIT STATUS > TEST > LAST TEST STATUS

Read security: 5

Displays the status of the last test call made through this dedicated dial backup circuit. The following status messages may display:

IDLE

No current test call on this dedicated dial backup circuit

PASSED

Passed last manual or scheduled test

FAILED

Failed last manual or scheduled test

CIRCUIT STATUS > TEST > PASS : FAIL

Read security: 5

Displays the number of successful and unsuccessful test calls made through this dedicated dial backup circuit.

CIRCUIT STATUS > TEST > TEST NOW

Write security: 5; Read security: 5

Press to initiate a test call on the dedicated dial backup circuit.

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© 2002 ADTRAN, Inc.

61200305L1-1F

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ADTRAN 1200305L1 No current test call on this dedicated dial backup circuit, Passed last manual or scheduled test