P R E L I M I N A R Y | AMD |
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AC CHARACTERISTICS
5.0V MEMORY BUS INTERFACE ABSOLUTE MAXIMUM RATINGS
Storage Temperature: . . . . . . . . . . . .
Ambient Temperature Under Bias: . . .
Supply Voltage to AVSS
or DVSS (AVDD, DVDD): . . . . . . . . . . . . . .
Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability.
OPERATING RANGES
Commercial (C) Devices
Temperature (TA) . . . . . . . . . . . . . . . . . 0°C to + 70°C
Supply Voltages (VCC, VDDT, VDDU1, VDDU2, VDDM, VDDP)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.75 V to 5.25 V
Supply Voltages
(AVDD, VDD5) . . . . . . . . . . . . . . . . . . . . . . . . +5 V ± 5%
All inputs within the range: VSS – 0.5 V ≤ VIN ≤ VDD + 0.1 X VDD – where V SS and VDD are appropriate reference pins for a given input pin. (See section on power supply pin descriptions.)
CL = 50 pF unless otherwise noted
Operating ranges define those limits between which the func- tionality of the device is guaranteed.
MEMORY BUS READ ACCESS
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Symbol | Parameter Description | Test Conditions | Min | Max | Unit |
tmAD | MA[16:0] valid from CLKIN ↓ |
| 2 | 60 | ns |
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tmCD | CE active delay from CLKIN ↓ | Note 1 | 2 | 60 | ns |
tmOD | MOE active delay from CLKIN ↓ |
| 2 | 60 | ns |
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tmOLZ | MOE ↓ to MD[7:0] driven | 0 wait states | 0 | 30 | ns |
| (Note 3) | 1 wait state |
| 80 | ns |
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| 2 wait states |
| 130 | ns |
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tmAA | Address Read Access Time | 0 wait states |
| 55 | ns |
| (Note 3) | 1 wait state |
| 105 | ns |
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| 2 wait states |
| 155 | ns |
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tmACS | CE Read Access Time | 0 wait states |
| 55 | ns |
| (Notes 1, 3) | 1 wait state |
| 105 | ns |
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| 2 wait states |
| 155 | ns |
tmOE | MOE Read Access Time | 0 wait states |
| 30 | ns |
| (Note 3) | 1 wait state |
| 80 | ns |
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| 2 wait states |
| 130 | ns |
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tmRI | CE Inactive Time | Notes 1, 2 | 0 |
| ns |
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tmAH | MA[16:0] valid hold from MOE − | Note 1 |
| ns | |
tmCH | CE valid hold from MOE − |
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| ns | |
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tmH | MD[7:0] valid hold from MOE − | Note 2 | 0 |
| ns |
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tmHZ | MD[7:0] inactive from MOE − | Note 2 | 0 | 2 X | ns |
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Notes:
1.CE = one of: FCE, SCE, XCE
2.Parameter not included in the production test.
3.Value is dependent upon TCLKIN value. Value given is for CLKIN = 40 MHz.
Am79C930 | 137 |