Toshiba e-Studio250, e-Studio200 manual Function Test 06.DRAM Test 07.CLOCK IC Test 08.SCANNER Test

(7) 07. CLOCK IC TEST

After programming the fixed data and time on the clock IC, the test reads the programmed data and time and checks whether or not they are correct

<Key used in operation>

1 3 Power ON

07.CLOCK IC TEST Select test menu

SET

Cancel

<Display messages>

FUNCTION TEST 05.SRAM TEST 06.DRAM TEST 07.CLOCK IC TEST

CLOCK IC TEST

OK

or

CLOCK IC TEST

NG

(8) 08. SCANNER TEST

The read/write test is performed on the RAM built in the image processing LSI.

<Key used in operation>

1 3 Power ON

08.SCANNER TEST Select test menu

<Display messages>

FUNCTION TEST 06.DRAM TEST 07.CLOCK IC TEST 08.SCANNER TEST

SET

Cancel

SCANNER TEST OK

or

SCANNER TEST NG

e-STUDIO160/200/250 ADJUSTMENT ITEMS 1 - 34 December 2002 TOSHIBA TEC