16.4

Instruction Register

16-2

16.5

Public Instructions

16-2

 

16.5.1

EXTEST (00000)

16-3

 

16.5.2

SAMPLE/PRELOAD (00001)

16-3

 

16.5.3

CLAMP (00100)

16-3

 

16.5.4

HIGHZ (00101)

16-4

 

16.5.5

IDCODE (00110)

16-4

 

16.5.6

BYPASS (11111)

16-4

16.6

Test Data Registers

16-5

 

16.6.1

Bypass Register

16-5

 

16.6.2

SA-1100 Device Identification (ID) Code Register

16-6

 

16.6.3

SA-1100Boundary-Scan (BS) Register

16-6

16.7

Boundary-Scan Interface Signals

16-7

A

 

Register Summary

A-1

B

 

3.6864–MHz Oscillator Specifications

B-1

B.1

Specifications

B-1

 

B.1.1

System Specifications

B-1

 

 

B.1.1.1. Parasitic Capacitance Off-chip

 

 

 

Between PXTAL and PEXTAL

B-2

 

 

B.1.1.2. Parasitic Capacitance Off-chip

 

 

 

Between PXTAL or PEXTAL and VSS

B-2

 

 

B.1.1.3. Parasitic Resistance Between PXTAL and PEXTAL

B-2

 

 

B.1.1.4. Parasitic Resistance Between PXTAL or PEXTAL and VSS...

B-2

 

B.1.2

Quartz Crystal Specification

B-3

C

 

32.768–kHz Oscillator Specifications

C-1

C.1

Specifications

C-1

 

C.1.1

System Specifications

C-1

 

 

C.1.1.1. Temperature Range

C-1

 

 

C.1.1.2. Current Consumption

C-1

 

 

C.1.1.3. Startup Time

C-1

 

 

C.1.1.4. Frequency Shift Due to Temperature Effect on the Circuit

C-2

 

 

C.1.1.5. Parasitic Capacitance Off-chip

 

 

 

Between TXTAL and TEXTAL

C-2

 

 

C.1.1.6. Parasitic Capacitance Off-chip

 

 

 

Between TXTAL or TEXTAL and VSS

C-2

 

 

C.1.1.7. Parasitic Resistance Between TXTAL and TEXTAL

C-2

 

 

C.1.1.8. Parasitic Resistance Between TXTAL or TEXTAL and VSS ...

C-2

 

C.1.2

Quartz Crystal Specification

C-3

D

 

Internal Test

D-1

D.1

Test Unit Control Register (TUCR)

D-1

xvi

SA-1100 Developer’s Manual

Page 16
Image 16
Intel SA-1100 manual Register Summary MHz Oscillator Specifications, KHz Oscillator Specifications, Internal Test