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Agilent Technologies 1690, 1680 manual Acquire and verify the test data

Models: 1690 1680

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Acquire and verify the test data

Chapter 3: Testing Performance

To test the time interval accuracy

bIn the pop-up menu, select Rising Edge.

Acquire and verify the test data

1Click the Run icon to fill acquisition memory.

2Set up the M1 marker for time interval measurement: a From the main menu, choose Markers>Properties....

b In the Marker Properties tab of the Waveform Properties dialog, select the M1 marker.

c In the Position box, select Value.

dClick Occurs....

eIn the Value dialog, enter “1” in the Find occurrences field.

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Agilent Technologies 1690, 1680 manual Acquire and verify the test data

Contents

Agilent Technologies 1680/90-Series Logic Analyzer Service GuideThe Agilent 1680/90-Series Logic Analyzer-At a Glance FeaturesService Strategy In This Book 3 Testing Performance ContentsTo make the test connectors The Agilent 1680/90-Series Logic Analyzer-At a GlanceTo set up the logic analyzer for the state mode tests Contents4 Calibrating and Adjusting To test the threshold accuracy5 Troubleshooting ContentsTroubleshooting the Agilent 1680A,AD-series Troubleshooting the Agilent 1690A,AD-series1690A,AD-series disassembly/assembly Contents8 Theory of Operation Agilent 1680A,AD-series Logic Analyzer TheoryGeneral Information Accessories Available AccessoriesSpecifications CharacteristicsSetup/Hold Time Auxiliary Power ProbesOperating Environment for indoor use only Dimensions 1680A,AD-Series 1690A,AD-SeriesChapter 1 General Information Chapter 1 General Information Recommended Test EquipmentEquipment Required EquipmentPreparing for Use Operating Environment Power RequirementsStorage To inspect the logic analyzerTo connect the 1690A,AD-series logic analyzer to a host PC To apply power1 Connect the power cord to the instrument and to the power source 2 Turn on the power switch located on the front panelTo clean the logic analyzer To start the user interfaceTo test the logic analyzer Testing Performance Test Strategy The Logic Analyzer InterfaceTest Interval Performance Test RecordTo make the test connectors a Solder a jumper wire to all pins on one side of the Berg strip Set up the test equipment To set up the test equipment and the logic analyzerSet up the 1680A,AD-series logic analyzer To perform the logic analyzer self-tests Set up the 1690A,AD-series logic analyzerChapter 3 Testing Performance To set up the test equipment and the logic analyzerTo set up the test equipment and the logic analyzer Chapter 3 Testing Performance3 Set the reporting level 4 Select the tests you want to run 5 Click StartChapter 3 Testing Performance To reset the self-test options, click ResetTo set up the test equipment and the logic analyzer 6 Click Close to close the Analysis System Self Tests dialogTo test the threshold accuracy Set up the equipmentConnect and configure the logic analyzer Test the ECL Threshold Test the 0 V User Threshold Test the next pod To set up the logic analyzer for the state mode tests To set up the logic analyzer for the state mode tests3 Configure the trigger according to your logic analyzer select the M1 marker c In the Position box, select Value i Click OK to close the Value dialog Set up the equipment To test the single-clock, single-edge, state acquisitionConnect and configure the logic analyzer To test the single-clock, single-edge, state acquisitionTesting Chapter 3 Testing PerformanceTo test the single-clock, single-edge, state acquisition Connect the 1680/81/90/91A,AD Logic Analyzer to the Pulse GeneratorPod 1 clock/data channel Clk 1682A,AD or 1692A,AD onlyVerify the test signal Check the setup/hold combination 3 Select the logic analyzer sample positions The following clock configurations will be used in steps 4, 5, and a In the Analyzer Setup dialog, click on the Sampling tabChapter 3 Testing Performance d Click OK to close the Sample Positions dialoge Click OK to close the Analyzer Setup dialog 5 Verify the test data then select Enter to display the setup time ∆ Time1-2 e Click OK to close the Analyzer Setup dialog 10 Verify the test data Test the next channels 1680/81A,AD and 1690/91A,AD Chapter 3 Testing PerformanceTo test the single-clock, single-edge, state acquisition Set up the equipment To test the multiple-clock state acquisition1 If you have not already done so, do the following procedures 2 Increase the pulse generator channel 2 width to 3.000 ns1680A, AD or 1690A, AD only Connect and configure the logic analyzerConnect to 8133A Channel 2 OutputClock/data channel for Pod 1, 2, 3, and 4 Clk 1, Clk 2, Clk 3, Clk 1682A, AD or 1692A, AD onlyVerify the test signal Check the setup/hold with single clock edges, multiple clocks 3 Select the clocks to be tested d Connect all clock channels to the pulse generator channel 1 output Page Test the next channels 1680/81A, AD and 1690/91A, AD To test the single-clock, multiple-edge, state acquisition Set up the equipmentTo test the single-clock, multiple-edge, state acquisition Testing Connect and configure the logic analyzerConnect the 1680/81/90/91A,AD Logic Analyzer to the Pulse Generator Connect to 8133A1Pod 1, channel 3 Pod 2, channel 3 Pod 3, channel 3 Pod 4, channel Verify the test signal Check the setup/hold with single clock, multiple clock edges Page The following clock configurations will be used in steps 3, 4, and The test passes when the logic analyzer finds all occurrences of the patterns programmed into the Markers. If the test passes, record a Pass in the performance test record under single-clock single-edge next to the clock and edge being tested Chapter 3 Testing Performance Test the next channels 1680/81A,AD and 1690/91A,ADTo test the single-clock, multiple-edge, state acquisition To test the time interval accuracy Set up the equipmentTo test the time interval accuracy 3 Set up the function generator according to the following table Connect and configure the logic analyzerd Select an Acquisition Depth of 256K Acquire and verify the test data f Click OK to close the Value dialog Chapter 3 Testing Performance Performance Test RecordSettings Performance Test RecordSettings Chapter 3 Testing PerformancePerformance Test Record Performance Test Record continuedSettings Chapter 3 Testing PerformancePerformance Test Record Performance Test Record continuedPerformance Test Record Chapter 3 Testing PerformanceCalibrating and Adjusting Chapter 4 Calibrating and Adjusting Logic analyzer calibrationTroubleshooting 2 Install the fan guard onto the chassis To install the fan guarda Position the chassis so the handle side is up b Slide the fan guard onto the chassis over the fansc Install the optional screws as shown To use the flowchartsTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Troubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTo test the power supply voltages To check the power-up tests5 Using DVM, measure the power supply voltages To test the LCD display signals To test disk drive voltages 6 Troubleshoot a flexible disk drive. a Apply power to the instrument To verify the CD-ROM To recover the operating system To reinstall the operating systemProblems running the Application Software Problems with the Operating System Troubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1690A,AD-series Troubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTask Manager To verify connectivityTo test the power supply voltages Device Managera Click on the Start button in the task bar, then select Shut Down Troubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTo run the self-tests General TroubleshootingChapter 5 Troubleshooting General TroubleshootingGeneral Troubleshooting Chapter 5 Troubleshooting6 Set the reporting level 7 Select the tests you want to run 8 Click Start9 Click Close to close the Analysis System Self Tests dialog Green LEDs Acquisition board status LEDsRed LED Normal Operation1 Turn on the equipment and the logic analyzer To test the logic analyzer probe cablesCOMP Disabled LED Off COMP Disabled LED Off5 Configure the pod under test Return to Troubleshooting flowchart To check the BNC Trigger input/output signalsanalyzer Trigger In BNC Recommended To test the auxiliary powerReplacing Assemblies 1680A,AD-series disassembly/assembly Prepare the instrument for disassemblyTo remove the chassis from the sleeve To remove the acquisition board Steps to remove probe shroud from acquisition board To remove the power supply To remove the hard disk drive To remove the CD-ROM drive assembly To remove the flexible disk drive 5 Reverse this procedure to install the flexible disk drive PCI IEEE 1394 board slot 2, closest to the CD-ROM drive To remove the PCI boardsPCI display board slot slot covers slot 3 and slot PCI IEEE 1394 board IEEE 1394 cable PCI display board video cableTo remove the motherboard power cable from connector CN1 CPU fan cableaudio cable from connector CD Transfer the I/O panel to the replacement board 5 Install 6 hex studs onto the motherboard ports and tighten To remove the front panel assembly on/off cable accessed from the bottom of the chassis keyboard cableinverter cable 6 Reverse this procedure to install the front panel assembly Remove the on/off switch To disassemble the front panel assemblyRemove the front panel circuit board Remove the LCD displayTo remove the distribution board To remove the inverter board To remove the fans To remove the cable tray Prepare the instrument for disassembly 1690A,AD-series disassembly/assembly1690A,AD-series disassembly/assembly To remove the chassis from the sleeveTo remove the fascia 4 Remove the fascia away from the front panel To remove the acquisition board 1 Do the following proceduresTo remove the power supply To remove the deckTo remove the distribution board To remove the fans To remove the line filter To remove the front panel and front frame Chapter 6 Replacing Assemblies 1690A,AD-series disassembly/assemblyReplaceable Parts Replaceable Parts Ordering Parts listedParts not listed Direct mail order systemExchange Assemblies Replaceable Parts ListExploded View Chapter 7 Replaceable PartsExploded view of the Agilent 1680A,AD-series logic analyzer Chapter 7 Replaceable Parts Agilent 1680A,AD-Series Replaceable PartsReplaceable Parts Ref. DesCD-ROM drive assembly to chassis, sleeve to Replacement Pod Grounds - 5” QtyM4.0 x 0.70 8 mm T20 PH power supply to Chapter 7 Replaceable PartsReplaceable Parts Chapter 7 Replaceable PartsRef. Des DescriptionPower Supply Cable 14- and 10- pin power supply assembly, IEEE 1394 cable to chassisChapter 7 Replaceable Parts Replaceable PartsChapter 7 Replaceable Parts Front Panel AssemblyReplaceable Parts Ref. DesReplaceable Parts Chapter 7 Replaceable PartsRef. Des DescriptionExploded View Chapter 7 Replaceable PartsExploded view of the Agilent 1690A,AD-series logic analyzer Chapter 7 Replaceable Parts Agilent 1690A,AD-Series Replaceable PartsReplaceable Parts Ref. DesHex Nut acquisition board BNC connectors to Fascia Assembly includes the followingChapter 7 Replaceable Parts Replaceable PartsChapter 7 Replaceable Parts Power Supply On/Off Cable power supply toReplaceable Parts Ref. DesChapter 7 Replaceable Parts Power Cables and Plug ConfigurationsPlug Type CablePlug Type Chapter 7 Replaceable PartsCable Plug DescriptionTheory of Operation Block-Level Theory Agilent 1680A,AD-Series Logic Analyzer Block DiagramChapter 8 Theory of Operation Agilent 1680A,AD-series Logic Analyzer Theory Agilent 1680A,AD-series Logic Analyzer TheoryPower Supply Acquisition BoardLogic Acquisition Board Block Diagram Comparators. Two 9-channel comparators interpret the incoming data and clock signals as either high or low, depending on where the user-programmable threshold is set. The threshold voltage of each pod is individually programmed, and the voltage selected applies to the clock channel as well as the data channels of each pod A field programmable gate array FPGA bridges the 1394 interface to the rest of the acquisition board components. It also serves as the memory controller for the acquisition memory Front Panel Board Power Distribution BoardPower Supply Agilent 1690A,AD-series Logic Analyzer TheoryPower Distribution Board Acquisition BoardPower-up Self-Tests 1680A,AD-series Self-Tests DescriptionsConnectivity Tests 1690A,AD-series Acquisition Board Self Tests Logic Analyzer Self-Tests Self-Tests Descriptions Chapter 8 Theory of Operationconfigured to take a simple measurement. Test data is then created at the comparators and an acquisition taken. The resulting data is then downloaded and compared with known values Self-Tests Descriptions Chapter 8 Theory of OperationSafety Notices WarrantyNotices Manual Part Number