Agilent Technologies 1680, 1690 manual

Chapter 3: Testing Performance

To test the single-clock, multiple-edge, state acquisition

1Using the Delay mode of the pulse generator channel 2, position the pulses according to the setup time of the setup/hold combination selected,

+0.0 ps or –100 ps:

a On the Oscilloscope, select [Define meas] Define ∆ Time - Stop edge: rising.

b In the oscilloscope timebase menu, select Position. Using the oscilloscope knob, position the falling edge of the data waveform so that it is near the center of the display.

c On the oscilloscope, select [Shift] ∆ Time. Select Start src: channel 1, then select [Enter] to display the setup time (∆ Time(1)-(2)).

d Adjust the pulse generator channel 2 Delay until the pulses are aligned according to the setup time of the setup/hold combination selected, +0.0 ps or –100 ps.

2Select the logic analyzer sample positions:

a Click the Sampling Setup icon. The Analyzer Setup dialog opens with the Sampling tab displayed.

b Click Sample Positions....

c In the Sample Positions dialog, drag the blue bar for My Bus 1 to the sample position of the first setup/hold combination to be tested (or enter the value in the signal fields).

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