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Agilent Technologies Test the next channels 1680/81A,AD and 1690/91A,AD, Testing Performance

Models: 1690 1680

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Test the next channels (1680/81A,AD and 1690/91A,AD)

Chapter 3: Testing Performance

To test the single-clock, single-edge, state acquisition

Test the next channels (1680/81A,AD and 1690/91A,AD)

Connect the next combination of data channels and clock channels; then, test them.

Start with “Connect and configure the logic analyzer” on page 37, connect the next combination; then, continue through the complete test.

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Agilent Technologies manual Test the next channels 1680/81A,AD and 1690/91A,AD, Testing Performance

Contents

Agilent Technologies 1680/90-Series Logic Analyzer Service GuideThe Agilent 1680/90-Series Logic Analyzer-At a Glance FeaturesService Strategy In This Book The Agilent 1680/90-Series Logic Analyzer-At a Glance Contents3 Testing Performance To make the test connectorsTo test the threshold accuracy ContentsTo set up the logic analyzer for the state mode tests 4 Calibrating and AdjustingTroubleshooting the Agilent 1690A,AD-series Contents5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesAgilent 1680A,AD-series Logic Analyzer Theory Contents1690A,AD-series disassembly/assembly 8 Theory of OperationGeneral Information Accessories Available AccessoriesSetup/Hold Time SpecificationsCharacteristics Operating Environment for indoor use only Auxiliary PowerProbes Chapter 1 General Information Dimensions1680A,AD-Series 1690A,AD-Series Equipment Recommended Test EquipmentChapter 1 General Information Equipment RequiredPreparing for Use To inspect the logic analyzer Power RequirementsOperating Environment Storage2 Turn on the power switch located on the front panel To apply powerTo connect the 1690A,AD-series logic analyzer to a host PC 1 Connect the power cord to the instrument and to the power sourceTo test the logic analyzer To clean the logic analyzerTo start the user interface Testing Performance Performance Test Record The Logic Analyzer InterfaceTest Strategy Test IntervalTo make the test connectors a Solder a jumper wire to all pins on one side of the Berg strip Set up the test equipment To set up the test equipment and the logic analyzerSet up the 1680A,AD-series logic analyzer To set up the test equipment and the logic analyzer Set up the 1690A,AD-series logic analyzerTo perform the logic analyzer self-tests Chapter 3 Testing Performance4 Select the tests you want to run 5 Click Start Chapter 3 Testing PerformanceTo set up the test equipment and the logic analyzer 3 Set the reporting level6 Click Close to close the Analysis System Self Tests dialog To reset the self-test options, click ResetChapter 3 Testing Performance To set up the test equipment and the logic analyzerTo test the threshold accuracy Set up the equipmentConnect and configure the logic analyzer Test the ECL Threshold Test the 0 V User Threshold Test the next pod To set up the logic analyzer for the state mode tests To set up the logic analyzer for the state mode tests3 Configure the trigger according to your logic analyzer select the M1 marker c In the Position box, select Value i Click OK to close the Value dialog To test the single-clock, single-edge, state acquisition To test the single-clock, single-edge, state acquisitionSet up the equipment Connect and configure the logic analyzerConnect the 1680/81/90/91A,AD Logic Analyzer to the Pulse Generator Chapter 3 Testing PerformanceTesting To test the single-clock, single-edge, state acquisitionPod 1 clock/data channel Clk 1682A,AD or 1692A,AD onlyVerify the test signal Check the setup/hold combination 3 Select the logic analyzer sample positions d Click OK to close the Sample Positions dialog a In the Analyzer Setup dialog, click on the Sampling tabThe following clock configurations will be used in steps 4, 5, and Chapter 3 Testing Performancee Click OK to close the Analyzer Setup dialog 5 Verify the test data then select Enter to display the setup time ∆ Time1-2 e Click OK to close the Analyzer Setup dialog 10 Verify the test data To test the single-clock, single-edge, state acquisition Test the next channels 1680/81A,AD and 1690/91A,ADChapter 3 Testing Performance 2 Increase the pulse generator channel 2 width to 3.000 ns To test the multiple-clock state acquisitionSet up the equipment 1 If you have not already done so, do the following proceduresChannel 2 Output Connect and configure the logic analyzer1680A, AD or 1690A, AD only Connect to 8133AClock/data channel for Pod 1, 2, 3, and 4 Clk 1, Clk 2, Clk 3, Clk 1682A, AD or 1692A, AD onlyVerify the test signal Check the setup/hold with single clock edges, multiple clocks 3 Select the clocks to be tested d Connect all clock channels to the pulse generator channel 1 output Page Test the next channels 1680/81A, AD and 1690/91A, AD To test the single-clock, multiple-edge, state acquisition To test the single-clock, multiple-edge, state acquisitionSet up the equipment Connect to 8133A Connect and configure the logic analyzerTesting Connect the 1680/81/90/91A,AD Logic Analyzer to the Pulse Generator1Pod 1, channel 3 Pod 2, channel 3 Pod 3, channel 3 Pod 4, channel Verify the test signal Check the setup/hold with single clock, multiple clock edges Page The following clock configurations will be used in steps 3, 4, and The test passes when the logic analyzer finds all occurrences of the patterns programmed into the Markers. If the test passes, record a Pass in the performance test record under single-clock single-edge next to the clock and edge being tested To test the single-clock, multiple-edge, state acquisition Chapter 3 Testing PerformanceTest the next channels 1680/81A,AD and 1690/91A,AD To test the time interval accuracy To test the time interval accuracySet up the equipment 3 Set up the function generator according to the following table Connect and configure the logic analyzerd Select an Acquisition Depth of 256K Acquire and verify the test data f Click OK to close the Value dialog Performance Test Record Performance Test RecordChapter 3 Testing Performance SettingsPerformance Test Record continued Chapter 3 Testing PerformanceSettings Performance Test RecordPerformance Test Record continued Chapter 3 Testing PerformanceSettings Performance Test RecordPerformance Test Record Chapter 3 Testing PerformanceCalibrating and Adjusting Chapter 4 Calibrating and Adjusting Logic analyzer calibrationTroubleshooting b Slide the fan guard onto the chassis over the fans To install the fan guard2 Install the fan guard onto the chassis a Position the chassis so the handle side is upc Install the optional screws as shown To use the flowchartsTroubleshooting the Agilent 1680A,AD-series Troubleshooting the Agilent 1680A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Chapter 5 TroubleshootingTo test the power supply voltages To check the power-up tests5 Using DVM, measure the power supply voltages To test the LCD display signals To test disk drive voltages 6 Troubleshoot a flexible disk drive. a Apply power to the instrument To verify the CD-ROM Problems running the Application Software To recover the operating systemTo reinstall the operating system Problems with the Operating System Troubleshooting the Agilent 1690A,AD-series Troubleshooting the Agilent 1690A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTroubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingTask Manager To verify connectivityTo test the power supply voltages Device Managera Click on the Start button in the task bar, then select Shut Down Troubleshooting the Agilent 1690A,AD-series Chapter 5 TroubleshootingGeneral Troubleshooting General TroubleshootingTo run the self-tests Chapter 5 Troubleshooting7 Select the tests you want to run 8 Click Start Chapter 5 TroubleshootingGeneral Troubleshooting 6 Set the reporting level9 Click Close to close the Analysis System Self Tests dialog Normal Operation Acquisition board status LEDsGreen LEDs Red LED1 Turn on the equipment and the logic analyzer To test the logic analyzer probe cablesCOMP Disabled LED Off COMP Disabled LED Off5 Configure the pod under test Return to Troubleshooting flowchart To check the BNC Trigger input/output signalsanalyzer Trigger In BNC Recommended To test the auxiliary powerReplacing Assemblies To remove the chassis from the sleeve 1680A,AD-series disassembly/assemblyPrepare the instrument for disassembly To remove the acquisition board Steps to remove probe shroud from acquisition board To remove the power supply To remove the hard disk drive To remove the CD-ROM drive assembly To remove the flexible disk drive 5 Reverse this procedure to install the flexible disk drive PCI IEEE 1394 board IEEE 1394 cable PCI display board video cable To remove the PCI boardsPCI IEEE 1394 board slot 2, closest to the CD-ROM drive PCI display board slot slot covers slot 3 and slotaudio cable from connector CD To remove the motherboardpower cable from connector CN1 CPU fan cable Transfer the I/O panel to the replacement board 5 Install 6 hex studs onto the motherboard ports and tighten inverter cable To remove the front panel assemblyon/off cable accessed from the bottom of the chassis keyboard cable 6 Reverse this procedure to install the front panel assembly Remove the LCD display To disassemble the front panel assemblyRemove the on/off switch Remove the front panel circuit boardTo remove the distribution board To remove the inverter board To remove the fans To remove the cable tray To remove the chassis from the sleeve 1690A,AD-series disassembly/assemblyPrepare the instrument for disassembly 1690A,AD-series disassembly/assemblyTo remove the fascia 4 Remove the fascia away from the front panel To remove the acquisition board 1 Do the following proceduresTo remove the power supply To remove the deckTo remove the distribution board To remove the fans To remove the line filter To remove the front panel and front frame Chapter 6 Replacing Assemblies 1690A,AD-series disassembly/assemblyReplaceable Parts Direct mail order system Parts listedReplaceable Parts Ordering Parts not listedExchange Assemblies Replaceable Parts ListExploded view of the Agilent 1680A,AD-series logic analyzer Exploded ViewChapter 7 Replaceable Parts Ref. Des Agilent 1680A,AD-Series Replaceable PartsChapter 7 Replaceable Parts Replaceable PartsChapter 7 Replaceable Parts Replacement Pod Grounds - 5” QtyCD-ROM drive assembly to chassis, sleeve to M4.0 x 0.70 8 mm T20 PH power supply toDescription Chapter 7 Replaceable PartsReplaceable Parts Ref. DesReplaceable Parts assembly, IEEE 1394 cable to chassisPower Supply Cable 14- and 10- pin power supply Chapter 7 Replaceable PartsRef. Des Front Panel AssemblyChapter 7 Replaceable Parts Replaceable PartsDescription Chapter 7 Replaceable PartsReplaceable Parts Ref. DesExploded view of the Agilent 1690A,AD-series logic analyzer Exploded ViewChapter 7 Replaceable Parts Ref. Des Agilent 1690A,AD-Series Replaceable PartsChapter 7 Replaceable Parts Replaceable PartsReplaceable Parts Fascia Assembly includes the followingHex Nut acquisition board BNC connectors to Chapter 7 Replaceable PartsRef. Des Power Supply On/Off Cable power supply toChapter 7 Replaceable Parts Replaceable PartsCable Power Cables and Plug ConfigurationsChapter 7 Replaceable Parts Plug TypePlug Description Chapter 7 Replaceable PartsPlug Type CableTheory of Operation Chapter 8 Theory of Operation Block-Level TheoryAgilent 1680A,AD-Series Logic Analyzer Block Diagram Agilent 1680A,AD-series Logic Analyzer Theory Agilent 1680A,AD-series Logic Analyzer TheoryLogic Acquisition Board Block Diagram Power SupplyAcquisition Board Comparators. Two 9-channel comparators interpret the incoming data and clock signals as either high or low, depending on where the user-programmable threshold is set. The threshold voltage of each pod is individually programmed, and the voltage selected applies to the clock channel as well as the data channels of each pod A field programmable gate array FPGA bridges the 1394 interface to the rest of the acquisition board components. It also serves as the memory controller for the acquisition memory Front Panel Board Power Distribution BoardAcquisition Board Agilent 1690A,AD-series Logic Analyzer TheoryPower Supply Power Distribution BoardConnectivity Tests 1690A,AD-series Power-up Self-Tests 1680A,AD-seriesSelf-Tests Descriptions Acquisition Board Self Tests Logic Analyzer Self-Tests Self-Tests Descriptions Chapter 8 Theory of Operationconfigured to take a simple measurement. Test data is then created at the comparators and an acquisition taken. The resulting data is then downloaded and compared with known values Self-Tests Descriptions Chapter 8 Theory of OperationManual Part Number WarrantySafety Notices Notices