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Agilent Technologies 1680, 1690 manual Block-Level Theory, Theory of Operation

Models: 1690 1680

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Chapter 8: Theory of Operation

Chapter 8: Theory of Operation

The information in this chapter will help you understand how the logic analyzer operates and what the self-tests are testing. This information is not intended for component-level repair.

Block-Level Theory

The block-level theory is divided into two parts: theory for the logic analyzer and theory for the acquisition boards. A block diagram is shown with each theory.

Agilent 1680A,AD-Series Logic Analyzer Block Diagram

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Agilent Technologies Block-Level Theory, Theory of Operation, Agilent 1680A,AD-Series Logic Analyzer Block Diagram

Contents

Service Guide Agilent Technologies 1680/90-Series Logic AnalyzerFeatures The Agilent 1680/90-Series Logic Analyzer-At a GlanceService Strategy In This Book Contents 3 Testing PerformanceTo make the test connectors The Agilent 1680/90-Series Logic Analyzer-At a GlanceContents To set up the logic analyzer for the state mode tests4 Calibrating and Adjusting To test the threshold accuracyContents 5 TroubleshootingTroubleshooting the Agilent 1680A,AD-series Troubleshooting the Agilent 1690A,AD-seriesContents 1690A,AD-series disassembly/assembly8 Theory of Operation Agilent 1680A,AD-series Logic Analyzer TheoryGeneral Information Accessories Accessories AvailableCharacteristics SpecificationsSetup/Hold Time Probes Auxiliary PowerOperating Environment for indoor use only 1680A,AD-Series 1690A,AD-Series DimensionsChapter 1 General Information Recommended Test Equipment Chapter 1 General InformationEquipment Required EquipmentPreparing for Use Power Requirements Operating EnvironmentStorage To inspect the logic analyzerTo apply power To connect the 1690A,AD-series logic analyzer to a host PC1 Connect the power cord to the instrument and to the power source 2 Turn on the power switch located on the front panelTo start the user interface To clean the logic analyzerTo test the logic analyzer Testing Performance The Logic Analyzer Interface Test StrategyTest Interval Performance Test RecordTo make the test connectors a Solder a jumper wire to all pins on one side of the Berg strip To set up the test equipment and the logic analyzer Set up the test equipmentSet up the 1680A,AD-series logic analyzer Set up the 1690A,AD-series logic analyzer To perform the logic analyzer self-testsChapter 3 Testing Performance To set up the test equipment and the logic analyzerChapter 3 Testing Performance To set up the test equipment and the logic analyzer3 Set the reporting level 4 Select the tests you want to run 5 Click StartTo reset the self-test options, click Reset Chapter 3 Testing PerformanceTo set up the test equipment and the logic analyzer 6 Click Close to close the Analysis System Self Tests dialogSet up the equipment To test the threshold accuracyConnect and configure the logic analyzer Test the ECL Threshold Test the 0 V User Threshold Test the next pod To set up the logic analyzer for the state mode tests To set up the logic analyzer for the state mode tests3 Configure the trigger according to your logic analyzer select the M1 marker c In the Position box, select Value i Click OK to close the Value dialog To test the single-clock, single-edge, state acquisition Set up the equipmentConnect and configure the logic analyzer To test the single-clock, single-edge, state acquisitionChapter 3 Testing Performance TestingTo test the single-clock, single-edge, state acquisition Connect the 1680/81/90/91A,AD Logic Analyzer to the Pulse Generator1682A,AD or 1692A,AD only Pod 1 clock/data channel ClkVerify the test signal Check the setup/hold combination 3 Select the logic analyzer sample positions a In the Analyzer Setup dialog, click on the Sampling tab The following clock configurations will be used in steps 4, 5, andChapter 3 Testing Performance d Click OK to close the Sample Positions dialoge Click OK to close the Analyzer Setup dialog 5 Verify the test data then select Enter to display the setup time ∆ Time1-2 e Click OK to close the Analyzer Setup dialog 10 Verify the test data Chapter 3 Testing Performance Test the next channels 1680/81A,AD and 1690/91A,ADTo test the single-clock, single-edge, state acquisition To test the multiple-clock state acquisition Set up the equipment1 If you have not already done so, do the following procedures 2 Increase the pulse generator channel 2 width to 3.000 nsConnect and configure the logic analyzer 1680A, AD or 1690A, AD onlyConnect to 8133A Channel 2 Output1682A, AD or 1692A, AD only Clock/data channel for Pod 1, 2, 3, and 4 Clk 1, Clk 2, Clk 3, ClkVerify the test signal Check the setup/hold with single clock edges, multiple clocks 3 Select the clocks to be tested d Connect all clock channels to the pulse generator channel 1 output Page Test the next channels 1680/81A, AD and 1690/91A, AD Set up the equipment To test the single-clock, multiple-edge, state acquisitionTo test the single-clock, multiple-edge, state acquisition Connect and configure the logic analyzer TestingConnect the 1680/81/90/91A,AD Logic Analyzer to the Pulse Generator Connect to 8133A1Pod 1, channel 3 Pod 2, channel 3 Pod 3, channel 3 Pod 4, channel Verify the test signal Check the setup/hold with single clock, multiple clock edges Page The following clock configurations will be used in steps 3, 4, and The test passes when the logic analyzer finds all occurrences of the patterns programmed into the Markers. If the test passes, record a Pass in the performance test record under single-clock single-edge next to the clock and edge being tested Test the next channels 1680/81A,AD and 1690/91A,AD Chapter 3 Testing PerformanceTo test the single-clock, multiple-edge, state acquisition Set up the equipment To test the time interval accuracyTo test the time interval accuracy Connect and configure the logic analyzer 3 Set up the function generator according to the following tabled Select an Acquisition Depth of 256K Acquire and verify the test data f Click OK to close the Value dialog Performance Test Record Chapter 3 Testing PerformanceSettings Performance Test RecordChapter 3 Testing Performance SettingsPerformance Test Record Performance Test Record continuedChapter 3 Testing Performance SettingsPerformance Test Record Performance Test Record continuedChapter 3 Testing Performance Performance Test RecordCalibrating and Adjusting Logic analyzer calibration Chapter 4 Calibrating and AdjustingTroubleshooting To install the fan guard 2 Install the fan guard onto the chassisa Position the chassis so the handle side is up b Slide the fan guard onto the chassis over the fansTo use the flowcharts c Install the optional screws as shownChapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesTroubleshooting the Agilent 1680A,AD-series Chapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1680A,AD-seriesTo check the power-up tests To test the power supply voltages5 Using DVM, measure the power supply voltages To test the LCD display signals To test disk drive voltages 6 Troubleshoot a flexible disk drive. a Apply power to the instrument To verify the CD-ROM To reinstall the operating system To recover the operating systemProblems running the Application Software Problems with the Operating System Chapter 5 Troubleshooting Troubleshooting the Agilent 1690A,AD-seriesTroubleshooting the Agilent 1690A,AD-series Chapter 5 Troubleshooting Troubleshooting the Agilent 1690A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1690A,AD-seriesChapter 5 Troubleshooting Troubleshooting the Agilent 1690A,AD-seriesTo verify connectivity Task ManagerDevice Manager To test the power supply voltagesa Click on the Start button in the task bar, then select Shut Down Chapter 5 Troubleshooting Troubleshooting the Agilent 1690A,AD-seriesGeneral Troubleshooting To run the self-testsChapter 5 Troubleshooting General TroubleshootingChapter 5 Troubleshooting General Troubleshooting6 Set the reporting level 7 Select the tests you want to run 8 Click Start9 Click Close to close the Analysis System Self Tests dialog Acquisition board status LEDs Green LEDsRed LED Normal OperationTo test the logic analyzer probe cables 1 Turn on the equipment and the logic analyzerCOMP Disabled LED Off COMP Disabled LED Off5 Configure the pod under test To check the BNC Trigger input/output signals Return to Troubleshooting flowchartanalyzer Trigger In BNC To test the auxiliary power RecommendedReplacing Assemblies Prepare the instrument for disassembly 1680A,AD-series disassembly/assemblyTo remove the chassis from the sleeve To remove the acquisition board Steps to remove probe shroud from acquisition board To remove the power supply To remove the hard disk drive To remove the CD-ROM drive assembly To remove the flexible disk drive 5 Reverse this procedure to install the flexible disk drive To remove the PCI boards PCI IEEE 1394 board slot 2, closest to the CD-ROM drivePCI display board slot slot covers slot 3 and slot PCI IEEE 1394 board IEEE 1394 cable PCI display board video cablepower cable from connector CN1 CPU fan cable To remove the motherboardaudio cable from connector CD Transfer the I/O panel to the replacement board 5 Install 6 hex studs onto the motherboard ports and tighten on/off cable accessed from the bottom of the chassis keyboard cable To remove the front panel assemblyinverter cable 6 Reverse this procedure to install the front panel assembly To disassemble the front panel assembly Remove the on/off switchRemove the front panel circuit board Remove the LCD displayTo remove the distribution board To remove the inverter board To remove the fans To remove the cable tray 1690A,AD-series disassembly/assembly Prepare the instrument for disassembly1690A,AD-series disassembly/assembly To remove the chassis from the sleeveTo remove the fascia 4 Remove the fascia away from the front panel 1 Do the following procedures To remove the acquisition boardTo remove the deck To remove the power supplyTo remove the distribution board To remove the fans To remove the line filter To remove the front panel and front frame 1690A,AD-series disassembly/assembly Chapter 6 Replacing AssembliesReplaceable Parts Parts listed Replaceable Parts OrderingParts not listed Direct mail order systemReplaceable Parts List Exchange AssembliesChapter 7 Replaceable Parts Exploded ViewExploded view of the Agilent 1680A,AD-series logic analyzer Agilent 1680A,AD-Series Replaceable Parts Chapter 7 Replaceable PartsReplaceable Parts Ref. DesReplacement Pod Grounds - 5” Qty CD-ROM drive assembly to chassis, sleeve toM4.0 x 0.70 8 mm T20 PH power supply to Chapter 7 Replaceable PartsChapter 7 Replaceable Parts Replaceable PartsRef. Des Descriptionassembly, IEEE 1394 cable to chassis Power Supply Cable 14- and 10- pin power supplyChapter 7 Replaceable Parts Replaceable PartsFront Panel Assembly Chapter 7 Replaceable PartsReplaceable Parts Ref. DesChapter 7 Replaceable Parts Replaceable PartsRef. Des DescriptionChapter 7 Replaceable Parts Exploded ViewExploded view of the Agilent 1690A,AD-series logic analyzer Agilent 1690A,AD-Series Replaceable Parts Chapter 7 Replaceable PartsReplaceable Parts Ref. DesFascia Assembly includes the following Hex Nut acquisition board BNC connectors toChapter 7 Replaceable Parts Replaceable PartsPower Supply On/Off Cable power supply to Chapter 7 Replaceable PartsReplaceable Parts Ref. DesPower Cables and Plug Configurations Chapter 7 Replaceable PartsPlug Type CableChapter 7 Replaceable Parts Plug TypeCable Plug DescriptionTheory of Operation Agilent 1680A,AD-Series Logic Analyzer Block Diagram Block-Level TheoryChapter 8 Theory of Operation Agilent 1680A,AD-series Logic Analyzer Theory Agilent 1680A,AD-series Logic Analyzer TheoryAcquisition Board Power SupplyLogic Acquisition Board Block Diagram Comparators. Two 9-channel comparators interpret the incoming data and clock signals as either high or low, depending on where the user-programmable threshold is set. The threshold voltage of each pod is individually programmed, and the voltage selected applies to the clock channel as well as the data channels of each pod A field programmable gate array FPGA bridges the 1394 interface to the rest of the acquisition board components. It also serves as the memory controller for the acquisition memory Power Distribution Board Front Panel BoardAgilent 1690A,AD-series Logic Analyzer Theory Power SupplyPower Distribution Board Acquisition BoardSelf-Tests Descriptions Power-up Self-Tests 1680A,AD-seriesConnectivity Tests 1690A,AD-series Acquisition Board Self Tests Logic Analyzer Self-Tests Chapter 8 Theory of Operation Self-Tests Descriptionsconfigured to take a simple measurement. Test data is then created at the comparators and an acquisition taken. The resulting data is then downloaded and compared with known values Chapter 8 Theory of Operation Self-Tests DescriptionsWarranty Safety NoticesNotices Manual Part Number