Agilent Technologies 1690, 1680 manual

Chapter 3: Testing Performance

To test the multiple-clock state acquisition

6Enable the pulse generator channel 1 COMP (with the LED on).

7Using the Delay mode of the pulse generator channel 1, position the pulses according to the setup/hold combination selected, +0.0 ps or –100 ps:

a On the Oscilloscope, select [Define meas] Define ∆ Time - Stop edge: falling.

b On the oscilloscope, select [Shift] ∆ Time. Select Start src: channel 1, then select [Enter] to display the setup time (∆ Time(1)-(2)).

c Adjust the pulse generator channel 1 Delay until the pulses are aligned according to the setup time of the setup/hold combination selected, +0.0 ps or –100 ps.

8Select the clocks to be tested:

a Click the Sampling Setup icon. The Analyzer Setup dialog opens.

b In the Sampling tab, click the Master button for one of the clocks and select Falling Edge.

c Repeat the above steps for each of the remaining clocks until all clocks

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