21264/EV68A Hardware Reference Manual
Testability and Diagnostics 11–1
11
Testability and Diagnostics
This chapterdescribes the 21264/EV68A user-oriented testability and diagnostic fea-
tures.These features include automatic power-up self-test, Icache initializationfrom
externalserial ROMs, and the serial diagnostic terminal port.
The boundary-scanregister, which is another testability and diagnostic feature,is listed
in AppendixB. The boundary-scan register is compatible with IEEEStandard 1149.1.
This chapteris organized as follows:
Testpins
SROM/serialdiagnostic terminal port
IEEE 1149.1port
TestStat_Hpin
Power-up self-test and initialization
Notes on IEEE 1149.1operation and compliance
The 21264/EV68A hasseveral manufacturing test features that are used only by the
factory,and they are beyond the scope of this chapter.

11.1 Test P ins

The 21264/EV68A testaccess ports include the IEEE 1149.1 test access port, a dual-
purposeS ROM/Serialdiagnostic terminal port, and a test status output pin. Table 11–1
liststhe test access port pins.
Table 11–1 Dedicated Test Port Pins
PinName Type Function
Tms_H Input IEEE1149.1 test mode select
Tdi_H Input IEEE1149.1 test data in
Trst_L Input IEEE 1149.1 test logic reset
Tck_ H Input IEEE1149.1 test clock
Tdo_H Output IEEE1149.1 test data output
SromData_H Input SROMdata/Diagnostic terminal data input