IXF1104
Table 37. Byte Swapper Behavior
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UPX_BADD |
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[1:0] |
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UPX_DATA_ | UPX_DATA_ | UPX_DATA | UPX_DATA | UPX_DATA | UPX_DATA | |||
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| [31:0] | [15:0] | [7:0] | [31:0] | [15:0] |
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| [7:0] |
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00 | [31:0] | [15:0] | [7:0] | [15:8] | [7:0] |
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[23:16 | [15:8] |
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| [31:24] |
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01 | – | – | [15:8] | – | – |
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10 | – | [31:16] | [23:16] | – | [23:16] |
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[31:24] |
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11 | – | – | [31:24] | – | – |
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1. In |
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5.10TAP Interface (JTAG)
The IXF1104 includes an IEEE 1149.1 compliant Test Access Port (TAP) interface used during boundary scan testing. The interface consists of the following five signals:
•TDI – Serial Data Input
•TMS – Test Mode Select
•TCLK – TAP Clock
•TRST_L – Active Low asynchronous reset for the TAP
•TDO – Serial Data Output
TDI and TMS require external
5.10.1TAP State Machine
The TAP signals drive a TAP controller, which implements the
•Asynchronous reset
•Synchronous reset
Asynchronous reset is achieved by pulsing or holding TRST_L Low. Synchronous reset is achieved by clocking TCLK with five clock pulses while TMS is held or floats High. This ensures that the boundary scan cells do not block the pin to core connections in the IXF1104.
122 | Datasheet |
Document Number: 278757
Revision Number: 007
Revision Date: March 25, 2004