8255A18255A·5

ABSOLUTE MAXIMUM RATINGS·

Ambient Temperature Under Bias

o°c to 70°C

Storage Temperature

_65°C to +150°C

Voltage on Any Pin

 

 

 

With Respect to Ground .

 

..... -

0.5V to +7V

Power Dissipation.

. . . . .

. . . . . . .

. . . . 1 Watt

'COMMENT: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional opera· tion of the device at these or any other conditions above those indicated in the operational sections of this specifi· cation is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

D.C. CHARACTERISTICS

TA = o°c to 70°C. Vee = +5V ±5%; GND = ov

SYMBOL

PARAMETER

MIN.

MAX.

UNIT

TEST CONDITIONS

VIL

Input Low Voltage

-0.5

0.8

V

 

VIH

Input High Voltage

2.0

Vee

V

 

VOL (DB)

Output Low Voltage (Data Bus)

 

0.45

V

IOL = 2.5mA

VOL (PER)

Output Low Voltage (Peripheral Port)

 

0.45

V

IOL =1.7mA

VOH(DB)

Output High Voltage (Data Bus)

2.4

 

V

IOH = -400!-LA

VOH(PER)

Output High Voltage (Peripheral Port)

2.4

 

V

IOH = -200!-LA

IDAR[11

Darlington Drive Current

-1.0

-4.0

mA

REXT = 750n; VEXT= 1.5V

lee

Power Supply Current

 

120

mA

 

IlL

Input Load Current

 

±10

!-LA

VIN = Vee to OV

IOFL

Output Float Leakage

 

±10

!-LA

VOUT = Vee to OV

Note 1: Available on any 8 pins from Port Band e.

CAPACITANCE

TA =25°C;Vee=GND=OV

SYMBOL

PARAMETER

MIN.

TYP.

MAX.

UNIT

TEST CONDITIONS

CIN

Input Capacitance

 

 

10

pF

fc = 1MHz

CliO

I/O Capacitance

 

 

20

pF

Unmeasured pins returned to GN o

~:O~'~

LJ l ~_~ : y y -------- . , .. VEXT"

I 100pF

'VEXTIs set at various voltages during testing to guarantee the specification.

Figure 24. Test Load Circuit (for dB)

9-33

AFN·00744A·'7

Page 348
Image 348
Intel mcs-48 manual Capacitance