Tektronix 071-0590-00 Result Definitions, Ber = Te / Tb, All Other Results Test Intervals Only

Reference

Result Definitions

The following section defines all results calculated by the Analyzer.

BER and Bit Errors

The following two results are calculated by all three Analyzer measurement processes (Totalize, Window, and Test):

Bit Errors : The total number of bit (logic) errors counted in the measurement interval. May be based on Totalize, Window, or Test measurement intervals.

Bit Error Rate (BER): Also known as "bit error ratio". May be based on Totalize, Window, or Test measurement intervals. Equals the number of bit errors divided by the total number of bits in the measurement interval:

BER = TE / TB
where:	TE = total number of bit errors in the interval
	TB = total number of bits in the interval

Note that BER results, when included in End-of-Test or Immediate Test Reports, are identified as follows:

AVE RATE: BER calculated over the entire TEST interval.

CUR RATE: BER calculated over the latest WINDOW interval.

All Other Results (Test Intervals Only)

The following results are calculated over Test intervals only. You can view all Test results using the VIEW-CUR and VIEW-PRE functions in the TEST Menu. Or, you can print all Test results at the end of Test intervals or immediately, using the REPORT or PRINT functions respectively in the TEST Menu.

SIG LOSS: The number of 20 ms intervals in which the Analyzer input activity detector sees no transitions on the input CLOCK signal for 20 ms.

SYNC LOSS: The number of 20 ms intervals in which pattern synchronization (lock) is lost.

PHASE ERR: The number of 20 ms intervals in which a phase error event is detected. The Analyzer will report a phase error when the active clock edge moves too close to the data waveform transition point, thus violating the input circuit setup or hold time.

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