Motorola MC68340 manual Section Ieee 1149.1 Test Access Port, Section Applications

Freescale Semiconductor, Inc.

11/2/95	SECTION 1: OVERVIEW	UM Rev 1
	Freescale Semiconductor, Inc.

TABLE OF CONTENTS (Continued)

Paragraph		P a g e
Number	Title	Number
8.3.3	Variable Duty-Cycle Square-Wave Generator	8-9
8.3.4	Variable-Width Single-Shot Pulse Generator	8-10
8.3.5	Pulse-Width Measurement	8-12
8.3.6	Period Measurement	8-13
8.3.7	Event Count	8-14
8.3.8	Timer Bypass	8-16
8.3.9	Bus Operation	8-17
8.3.9.1	Read Cycles	8-17
8.3.9.2	Write Cycles	8-17
8.3.9.3	Interrupt Acknowledge Cycles	8-17
8.4	Register Description	8-17
8.4.1	Module Configuration Register (MCR)	8-18
8.4.2	Interrupt Register (IR)	8-20
8.4.3	Control Register (CR)	8-20
8.4.4	Status Register (SR)	8-23
8.4.5	Counter Register (CNTR)	8-25
8.4.6	Preload 1 Register (PREL1)	8-25
8.4.7	Preload 2 Register (PREL2)	8-26
8.4.8	Compare Register (COM)	8-26
8.5	Timer Module Initialization Sequence	8-27
8.5.1	Timer Module Configuration	8-27
8.5.2	Timer Module Example Configuration Code	8-28

	Section	9
	IEEE 1149.1 Test Access Port
9.1	Overview	9-1
9.2	TAP Controller	9-2
9.3	Boundary Scan Register	9-3
9.4	Instruction Register	9-9
9.4.1	EXTEST (000)	9-10
9.4.2	SAMPLE/PRELOAD (001)	9-10
9.4.3	BYPASS (X1X, 101)	9-11
9.4.4	HI-Z (100)	9-11
9.5	MC68340 Restrictions	9-11
9.6	Non-IEEE 1149.1 Operation	9-12

Section 10

Applications

10.1	Minimum System Configuration	10-1
10.1.1	Processor Clock Circuitry	10-1
MOTOROLA	MC68340 USER'S MANUAL	xv
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