UM10237_2 © NXP B.V. 2008. All rights reserved.
User manual Rev. 02 — 19 December 2008 6 of 792
NXP Semiconductors UM10237
Chapter 1: LPC24XX Introductory information
Boundary scan for simplified board testing.
Versatile pin function selections allow more possibilities for using on-chip peripheral

functions.

4. Applications
Industrial control
Medical systems
Protocol converter
Communications
5. Ordering options

5.1 LPC2458 ordering options

5.2 LPC2460 ordering options

Table 3. LPC2458 ordering information
Type n umbe r Package
Name Description Versi on
LPC2458FET180 TFBGA180 plastic thin fine-pitch ball grid array package; 180 balls; body 12 x 12 x 0.8 mm SOT570-2
Table 4. LPC2458 ordering options
Type n umbe r Flash
(kB) SRAM (kB) External
bus Ethernet USB
OTG/
OHC/
DEV
+4kB
FIFO
CAN channels
SD/
MMC GP
DMA
ADC channels
DAC channels
Temp
range
Local bus
Ethernet buffer
GP/USB
RTC
Total
LPC2458FET180 512 64 16 16 2 98 16-bit MII/
RMII yes 2 yes yes 8 1 40°C to
+85 °C
Table 5. LPC2420/60 ordering information
Type n umbe r Package
Name Description Versi on
LPC2420FBD208 LQFP208 plastic low profile quad flat package; 208 leads; body 28 × 28 × 1.4 mm SOT459-1
LPC2460FBD208 LQFP208 plastic low profile quad flat package; 208 leads; body 28 × 28 × 1.4 mm SOT459-1
LPC2460FET208 TFBGA208 plastic thin fine-pitch ball grid array package; 208 balls; body 15 × 15 × 0.7 mm SOT950-1