Agilent Technologies Agilent E5250A manual HCI Measurement Program

NOTE

Executing Sample Programs

HCI Measurement Program

HCI Measurement Program

This section explains how to use and modify the HCI measurement sample program. This section consists of the following sections:

•“Introduction”

•“Adding the Bias Source Control Routine”

•“Setting up the Measurement Environment”

•“Executing the Program”

•“Modifying the Program”

Introduction

The Hot-Carrier-Induced (HCI) degradation of MOSFET parameters is measured by using Agilent 4155/4156 Semiconductor Parameter Analyzer, bias sources, and the E5250A with the E5255A card.

Two HP BASIC language programs are used to perform the HCI measurement:

•HCI Test Program (SP_MUX_M) performs HCI degradation test according to the JEDEC proceeding titled "A PROCEDURE FOR MEASURING HCI"

(29-JULY-93).

•Analysis Program (SP_MUX_A) determines the lifetime of MOSFET from the data measured by HCI test program.

The SP_MUX_M program flow is shown in Table 9-5.

Table 9-5 also lists the files that are used to set up the 4155/4156 for each part of the SP_MUX_M program. These setup files are stored on the E5250A Program Disk. So, the program disk must be in the 4155/4156's disk drive when you execute the program.

For details about a 4155/4156 setup file, GET the setup file and refer to the setup by using the 4155/4156.

To Add the Bias Source Control Routine

The HCI measurement sample program (SP_MUX_M) requires bias sources. You must modify or add a control routine for your bias sources to the program. Refer to “Adding the Bias Source Control Routine” on page 9-23.

Agilent E5250A User’s Guide, Edition 9 9-17