Executing Sample Programs

 

 

 

 

 

 

 

HCI Measurement Program

 

 

 

 

 

 

Figure 9-4

DC HCI Degradation Test Equipment Connections

 

 

 

 

BNC Cable (3ea.)

SLOT1

 

16494D-001 or 002

( 9 ea.)

 

 

Shielding Box

 

 

 

 

 

 

 

 

 

Output

 

 

 

 

 

BIAS SOURCE 1

Bias Input

 

 

 

1

 

24

 

 

SLOT2

 

 

1--24

 

to

 

BIAS SOURCE 2

Bias Input

 

 

25--48

 

25

to

48

 

 

 

 

 

 

 

SLOT3

 

 

 

 

 

 

 

E5250A

49--72

 

 

 

 

 

BIAS SOURCE 3

Bias Input

 

 

49

to

72

 

 

 

 

 

 

 

 

 

 

SMU

 

 

 

 

 

 

 

 

 

 

 

 

GPIB Cable

 

 

 

16495D

GNDU

 

 

 

 

 

 

 

 

 

 

 

 

 

16494A-003 (3ea.)

 

 

 

 

Drain

 

 

4155/4156

 

 

 

Gate

Sub

 

 

 

 

 

 

 

 

 

 

GNDU

 

 

 

 

Source

HP BASIC

41501

16494A-001 or 002

 

 

 

 

CONTROLLER

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1

2

 

 

24

 

 

 

 

 

25

26

 

 

48

 

GNDU

 

 

49

50

 

 

 

72

 

 

 

 

 

 

 

 

 

Device1

Device2

 

 

Device24

 

 

 

 

 

 

 

 

(Total 24ea.)

 

 

 

 

NOTE

Device used to Determine Stress Conditions

HCI test program (SP_MUX_M) uses Device1 above to determine stress voltages (Vdstr and Vgstr). So, during the program, you are prompted to replace Device1 after these voltages are determined.

9-26

Agilent E5250A User’s Guide, Edition 9

Page 282
Image 282
Agilent Technologies Agilent E5250A manual DC HCI Degradation Test Equipment Connections