Agilent Technologies Agilent E5250A manual To Execute HCI Test Program

Executing Sample Programs

HCI Measurement Program

To Execute HCI Test Program

1.Load the HCI test program (SP_MUX in this example), and press RUN function key. Then the following message is displayed on the computer screen.

Enter directory name for saving data. (default: test_data)

2.Type the name of directory for saving HCI test data, and press ENTER key. After executing the program, test data is saved to the directory in the diskette. If you press ENTER key with no input, the test data will be saved in "test_data" directory.

After this operation, the Ib-Vgs measurement is automatically executed, and the measurement results are displayed on the 4155/4156, as shown in Figure 9-6.

Also the program automatically extracts the gate stress voltage (Vgstr), which will be used later for stress testing.

3.Remove the device used to determine Vdstr and Vgstr after the following message is displayed.

"Connect HCI degradation test devices"

This device must be Device1, which was connected to the E5255A output port numbers 1, 25, 49, and GNDU as shown in Figure 9-4.

4.Connect a new device in place of device removed by previous step. Then press Continue function key to continue the program.

The program executes the leakage current tests, which determine the valid devices to use for stress testing.

If the measured leakage currents are within the limit, following message is displayed:

"Device No. = XX can be used"

If the measured leakage currents are not within the limit, following message is displayed:

"Device No. = XX shall not be used"

Then, the initial characterization (before stress) is performed for all valid devices.

Then, stress/interim characterization cycle is executed until stress termination conditions are met as described previously. In each interim characterization, Idlin, Gmmax, Vtext, and Vtci are determined. An example measurement is shown in Figure 9-7.

Agilent E5250A User’s Guide, Edition 9 9-29