Executing Sample Programs

Vth and Capacitance Measurement Program

Vth and Capacitance Measurement Program

This section introduces and explains how to use and modify the Vth and Capacitance measurement program. This section consists of the following sections:

“Introduction”

“Setting up the Measurement Environment”

“Executing the Program”

“Modifying the Program”

Introduction

This program measures the parameters of the devices shown in Table 9-1 by using the Agilent 4155/4156 Semiconductor Parameter Analyzer, the Agilent 4284A Precision LCR Meter, and the Agilent E5250A with the E5252A card.

The program flow is shown in Table 9-2. In this program, the 4155/4156 is set up by loading the 4155/4156 setup file E5252.MES, which is saved on the E5250A Program Disk. So, the program disk must be in the 4155/4156's disk drive when you execute the program.

Table 9-1

Devices and Parameters Measured

 

 

 

 

 

 

 

 

 

No. of

Measurement

Instrument

 

Device

Devices

 

Parameter

Used

 

 

Measured

 

 

 

 

 

 

 

 

 

 

N-channel MOSFET

1

Threshold Voltage (Vth)

4155/4156

 

 

 

 

 

 

Capacitor

1

Capacitance

4284A

 

 

 

 

 

Agilent E5250A User’s Guide, Edition 9

9-3

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Image 259
Agilent Technologies Agilent E5250A manual Vth and Capacitance Measurement Program, Introduction