Agilent E5250A User’s Guide, Edition 9 9-3
Executing Sample Programs
Vth and Capacitance Measurement Program
Vth and Capacitance Measurement Program
This section introduces and explains how to use and modify the Vth and
Capacitance measurement program. This section consists of the following sections:
• “Introduction”
• “Setting up the Measurement Environment”
• “Executing the Program”
• “Modifying the Program”

Introduction

This program measures the parameters of the devices shown in Table 9-1 by using
the Agilent 4155/4156 Semiconductor Parameter Analyzer, the Agilent 4284A
Precision LCR Meter, and the Agilent E5250A with the E5252A card.
The program flow is shown in Table 9-2 . I n this prog ram, the 4 155/4 156 i s se t up by
loading the 4155/4156 setup file E5252.MES, which is saved on the E5250A
Program Disk. So, the program disk must be in the 415 5/41 56's d isk dri ve when you
execute the program.
Table 9-1 Devices and Parameters Measured
Device No. of
Devices
Measured
Measurement
Parameter Instrument
Used
N-channel MOSFET 1 Threshold Voltage (Vth) 4155/4156
Capacitor 1 Capacitance 4284A