MCF51QE128 MCU Series Reference Manual, Rev. 3
Freescale Semiconductor 131
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6.7.5.7 Port E Slew Rate Enable Register (PTESE)6.7.5.8 Port E Drive Strength Selection Register (PTEDS)

Table 6-29. PTEPE Register Field Descriptions

Field Description
7–0
PTEPEn
Internal Pull Enable for Port E Bits. Each of these control bits determines if the internal pull-up device is enabled
for the associated PTE pin. For port E pins configured as outputs, these bits have no effect and the internal pull
devices are disabled.
0 Internal pull-up device disabled for port E bit n.
1 Internal pull-up device enabled for port E bit n.
76543210
R
PTESE7 PTESE6 PTESE5 PTESE4 PTESE3 PTESE2 PTESE1 PTESE0
W
Reset:00000000

Figure 6-33. Slew Rate Enable for Port E Register (PTESE)

Table 6-30. PTESE Register Field Descriptions

Field Description
7–0
PTESEn
Output Slew Rate Enable for Port E Bits. Each of these control bits determines if the output slew rate control is
enabled for the associated PTE pin. For port E pins configured as inputs, these bits have no effect.
0 Output slew rate control disabled for port E bit n.
1 Output slew rate control enabled for port E bit n.
76543210
R
PTEDS7 PTEDS6 PTEDS5 PTEDS4 PTEDS3 PTEDS2 PTEDS1 PTEDS0
W
Reset:00000000

Figure 6-34. Drive Strength Selection for Port E Register (PTEDS)

Table 6-31. PTEDS Register Field Descriptions

Field Description
7–0
PTEDSn
Output Drive Strength Selection for Port E Bits. Each of these control bits selects between low and high output
drive for the associated PTE pin. For port E pins configured as inputs, these bits have no effect.
0 Low output drive strength selected for port E bit n.
1 High output drive strength selected for port E bit n.