
| Internal Test Descriptions | Agilent 35670A |
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[ DISTORTN ] | This test checks for noise and distortion in the input circuits of the A1 Input assembly or A2 | |
| Input assemblies. In this test, the A5 Analog assembly’s source outputs a signal that is | |
| connected to the input channels via the calibration path (CALP). For each channel in the A1 | |
| Input assembly, the signal is measured at 16.640 kHz for 5 Vpk ±0.5 Vpk and from 24.96 kHz | |
| to 51.2 kHz for 0 Vpk ±0.01V. For each channel in the A2 Input assemblies, the signal is | |
| measured at 8.320 kHz for 5 Vpk ±0.5 Vpk and from 12.48 kHz to 25.6 kHz for 0 Vpk ±0.01V. | |
[ FAST BUS ] | This test verifies that the fast bus is operating correctly. In this test, the microprocessor on the | |
| A7 CPU assembly writes data to the trigger gate array and digital tach on the A6 Digital | |
| assembly over the fast bus. The microprocessor then reads the data. |
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[ FIFO ] | This test verifies that the FIFO gate array on the A6 Digital assembly is operating correctly. In | |
| this test, the A7 CPU assembly’s microprocessor configures the FIFO gate array. The | |
| microprocessor then reads the control lines to check circuits internal to the gate array and verify | |
| correct configuration. The Trigger Gate Array [ TRIGGER ], Digital Filter Gate Array | |
| [ FILTER ], and LO Gate Array [ LO ] tests must pass for this test to pass. No data paths on | |
| the Digital assembly are checked. |
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[ FRONT PANEL ] | This test verifies that the IIC controller on the A11 Keyboard Controller assembly is operating | |
| correctly. In this test, the microprocessor on the A7 CPU assembly reads the IIC controller on | |
| the Keyboard Controller assembly and verifies that no | |
[ GPIB CONNECTOR ] This test was not implemented. |
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[ GPIB FUNC TEST ] | This test verifies that the GPIB interface on the A10 Rear Panel assembly is operating | |
| correctly. In this test, the A7 CPU assembly’s microprocessor sets the GPIB interface to a | |
| listen only state, then tests for a listen only state. |
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[ IIC BUS ] | This test verifies that the A7 CPU assembly can write to and read from all assemblies with IIC | |
| interfaces. This test also checks the A7 CPU assembly’s EEROM. The following assemblies | |
| have IIC interfaces: |
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| A1 Input |
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| A2 Input |
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| A5 Analog |
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| A6 Digital |
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| A8 Memory |
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| A10 Rear Panel |
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| A11 Keyboard Controller |
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[ INPUT | This test verifies that the | |
| operating correctly. In this test, the A5 Analog assembly’s source outputs a chirp signal that is | |
| connected to the input channels via the calibration path (CALP). For each channel, the power | |
| spectrum is measured at three frequencies with and without the | |
| path. |
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[ INPUT ICP ] | This test verifies that the ICP sources on the A1 Input assembly or A2 Input assemblies are | |
| operating correctly. In this test, the ICP sources are turned on, then measured for 25 ±10 Vdc. | |
| During this test, the front panel input BNC connectors must not be connected to anything. |