Agilent Technologies 35670-90066 manual Long Conf Test

	Agilent 35670A	Internal Test Descriptions
		Self-Test Descriptions
[ INPUT TRIGGER ]	This test checks the trigger-level circuits on the A5 Analog assembly for both positive and
	negative slope triggering. In this test, the A5 Analog assembly’s source outputs a 512 Hz,
	5 Vpk signal that is connected to the input channels via the calibration path (CALP).
[ INTERRUPT ]	This test verifies that the interrupt circuits on the A7 CPU assembly are operating correctly. In
	this test, the microprocessor writes to the multi-function peripheral interrupt registers and reads
	the registers for verification. This test does not actually set up an interrupt but does test the
	multi-function peripheral in greater depth than the [ MULTI FCTN PERIPHERL ] test.
[ LO ]	This test verifies that the local oscillator gate array on the A6 Digital assembly is operating
	correctly. In this test, the A7 CPU assembly’s microprocessor configures the local oscillator
	gate array. The microprocessor then reads the control lines to check circuits internal to the gate
	array and verify correct configuration. The microprocessor then checks the phase of its internal
	oscillator. The Trigger Gate Array [ TRIGGER ] test must pass for this test to pass. No data
	paths on the A6 Digital assembly are checked.
[ LONG CONF TEST ]	This test performs most of the self tests. The tests are performed in the following order:
	[ INTERRUPT ]
	[ MULTI FCTN PERIPHERL ]
	[ FRONT PANEL ]
	[ GPIB FUNC TEST ]
	[ DISK CONTROLLR ]
	[ DISK FIFO ]
	[ IIC BUS ]
	[ FAST BUS ]
	[ TRIGGER ]
	[ LO ]
	[ DIGITAL FILTER ]
	[ FIFO ]
	[ BASEBAND ]
	[ ZOOM ]
	[ DGTL SRCE THRU DSP ]
	[ SOURCE LO ]
	[ SOURCE TO CPU ]
	[ WITHOUT LO ]
	[ WITH LO ]
	[ ADC GATE ARRAY ]
	[ OFFSET ]
	[ DISTORTN ]
	[ INPUT TRIGGER ]
	[ INPUT A-WEIGHT ]
	[ AAF BYPASS ]
	[ QUICK CONF TEST ]
[ MULTI FCTN	This test verifies that the multi-function peripheral on the A7 CPU assembly is operating
PERIPHERL ]	correctly. In this test, the microprocessor writes to the multi-function peripheral, then reads the
	registers checking for errors. Further testing of the multi-function peripheral is done by the
	[ INTERRUPT ] test.

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