Agilent Technologies 35670-90066 manual Self Tests that Perform a Measurement

Internal Test Descriptions	Agilent 35670A
Self-Test Descriptions

Self Tests that Perform a Measurement

The following self tests perform measurements:

Self Test	Front Panel Softkey
Baseband	[ BASEBAND ]
Zoom	[ ZOOM ]
Source thru DSP	[ DGTL SRCE THRU DSP ]
ADC gate array	[ ADC GATE ARRAY ]
Source to CPU	[ SOURCE TO CPU ]
Source with LO	[ WITH LO ]
Source Without LO	[ WITHOUT LO ]
Input Offset	[ OFFSET ]
Input Distortion	[ DISTORTN ]
Input Trigger	[ INPUT TRIGGER ]
Input A-Wt Filter	[ INPUT A-WEIGHT ]
Input AAF/Bypass	[ AAF BYPASS ]
Input ICP Source	[ INPUT ICP ]

The measurements that these self tests perform are averaged measurements, with only one trace per average. Some hardware setup modes used in these self tests are not used by normal measurements and can not be accessed from the front panel.

The measurements bypass any standard corrections and do not perform calibration data corrections. Therefore, all self-test measurements using analog data have limits larger than the standard calibration tolerances.

Once the hardware is set up, data is taken and time records are processed according to the needs of the specific test. Some tests monitor overloads, others require spectrum data, and others require time record data. After the data is collected, it is compared to an internal reference specification to determine if the self test passed or failed. The pass or fail information along with any additional information is placed in the Test Log.

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