Agilent Technologies 35670-90066 manual Failing Self Test, Probable Faulty Assembly Adjustment

Models: 35670-90066

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Failing Self Test

 

Agilent 35670A

Troubleshooting the Analyzer

 

 

 

To perform self tests

 

Self-Test Troubleshooting Guide

 

Failing Self Test

Probable Faulty Assembly Adjustment

Troubleshooting Test

 

 

 

 

 

 

 

 

Interrupt

A7

CPU

CPU, Memory, and Buses,

 

 

 

page 4-18.

 

 

 

 

Mult Fctn Peripheral

A7

CPU

 

 

 

 

Front Panel

A11 Keyboard Controller

 

 

 

 

GPIB

A10 Rear Panel

 

 

 

 

 

Disk Controller

A7

CPU

 

 

 

 

Disk FIFO

A7 CPU

 

 

 

 

IIC Bus (If only one

Assembly failing. See Test

 

assembly is failing)

Log

 

 

 

 

IIC Bus (If multiple

See Test Log

IIC bus, page 4-25

assemblies are failing)

 

 

 

 

 

 

 

Fast Bus

A7

CPU

Fast bus, page 4-29

 

A6

Digital

 

 

 

 

 

Trigger Gate Array

A6

Digital †

 

 

 

 

 

LO Gate Array

A6

Digital

 

 

 

 

 

Digital Filter Gate Array

A6

Digital

 

 

 

 

 

FIFO

A6

Digital

 

 

 

 

Baseband Zoom

A5 Analog

 

ADC Gate Array

 

 

 

All other self tests pass

 

 

 

 

 

 

 

Baseband

A6

Digital

 

Zoom

 

 

 

All other self tests pass

 

 

 

 

 

 

 

Baseband

A5

Analog

Source and calibrator,

 

A6

Digital

page 4-45

 

 

 

 

Zoom

A5

Analog

Source and calibrator,

 

A6

Digital

page 4-45

 

 

 

 

Source through DSP

A6

Digital

 

 

 

 

 

Source LO

A6

Digital

 

 

 

 

 

Source to CPU

A6

Digital

 

Analyers with firmware revision A.00.00 may fail the Trigger Gate Array test when the A1/A2 Input or A5 Analog assemblies fail. Go to page 4-45,‘’To troubleshoot source and calibrator failures,’’ to determine the probable faulty assembly.

4-33

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Agilent Technologies 35670-90066 manual Failing Self Test, Probable Faulty Assembly Adjustment, Troubleshooting Test