Agilent Technologies 35670-90066 8-28, 10-9, 10-14, 5-17, 3-18, 3-22, 8-24, 8-25, 8-36, 7-12, 8-6

Models: 35670-90066

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Image 433
8-28

part number

7-5

 

 

fast bus

 

 

 

 

 

interface

8-28

 

 

self-test description

10-14

troubleshooting

4-29

fault log messages

10-9

FIFO gate array self test

10-14

flatness

 

 

 

 

 

adjustment

 

5-17

 

 

test

3-18

 

 

 

 

frequency accuracy test

3-22

frequency reference

 

 

adjustment

 

5-5

 

 

circuit description

8-24

clock

8-25

 

 

 

front panel

ii

 

 

 

part numbers

7-9

 

removing

6-8

 

 

self-test description

10-14

front panel connectors

8-36 - 8-37

See also BNC assembly

functional tests

 

 

 

See self tests

 

 

 

fuse 2-10

 

 

 

 

part numbers

7-12

 

G

GPIB

connector

2-12

 

 

interface

8-33

 

 

self-test description

10-14

signal descriptions 9-14

troubleshooting

4-31

GPIB commands

 

 

for adjustments

5-4

 

for self tests 10-18

 

grounding requirements

2-3

H

harmonic distortion test 3-25

I

IBASIC 8-2

ICP source 8-6,8-12

ICP supply test 3-41

IIC bus

controller

8-28

 

 

self-test description

10-14

 

signals 8-29, 9-8

 

 

troubleshooting

4-25

 

incoming inspection

2-5

 

individual self-test descriptions

10-13

initial verification troubleshooting 4-5

input

 

 

 

 

 

coupling test

3-24

 

 

resistance test

 

3-39

 

self-test description

10-14 - 10-15

input assembly

 

 

 

 

circuit description

8-6, 8-12

 

common mode adjustment 5-13

dc offset adjustment

5-10

 

flatness adjustment

5-17

 

part number

7-5

 

 

procedures required after replacing 6-4

signal descriptions

9-7

 

troubleshooting

4-51

 

troubleshooting four channels

4-54

installation

2-7

 

 

 

instrument BASIC 8-2interface

GPIB 2-12parallel 2-11serial 2-11

intermittent failures 4-31,4-40intermodulation distortion test 3-28interrupt self test 10-15

K

keyboard 2-14See primary keypad See secondary keypad

keyboard controller assembly circuit description 8-35part number 7-5

signal description 9-18

L

LO gate array self test

10-15

local oscillator

 

circuit description 8-22

See digital assembly

 

long confidence self test

10-15

3

Page 433
Image 433
Agilent Technologies 35670-90066 8-28, 10-9, 10-14, 5-17, 3-18, 3-22, 8-24, 8-25, 8-36, 7-12, 2-12, 8-33, 4-31, controller