Agilent Technologies 35670-90066 manual Power-on Test Description, Low-level Subtests

Internal Test Descriptions

This chapter describes the power-on test, calibration routine, fault log messages, and self tests. This chapter also contains a list of the GPIB commands for each self test.

Power-on Test Description

The power-on test is run when the analyzer is powered up. The calibration routine is run immediately following the power-on test. The power-on test exercises the

A7 CPU assembly and A8 Memory assembly. This test is divided into low-level and high-level subtests.

Low-level Subtests

The low-level power-on subtests exercise the core of the A7 CPU assembly and A8 Memory assembly. If an error occurs during the low-level subtests, the test stops and displays an error code on the A7 CPU assembly’s power-on test LEDs.

High-level Subtests

The high-level power-on subtests exercise the fast bus and the multi-function peripheral on the A7 CPU assembly. The high-level subtests are also self tests (see ‘’Self-Test Descriptions’’). If an error occurs during the high-level subtests, an error message is entered in the test log.

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