Agilent Technologies 35670-90066 manual TimesTimesP10ALL Continue

		Agilent 35670A	Troubleshooting the Analyzer
			To troubleshoot self-test lockup failures
		Step 4. Run the remaining self tests.
		• Connect the rear panel SOURCE output to the rear panel TACH input
		using a BNC cable.
		• Remove all cables from the front panel input connectors.
Caution		The ICP self test outputs approximately 30 Vdc on the input connectors. Before
		starting the self tests, disconnect all devices connected to the input connectors.
		Devices left connected during the ICP self test may be damaged.
	G	• Until a test fails or the analyzer locks up, press the following keys allowing
		enough time for each test to complete before pressing the next key :

[ Rtn ]

[ OTHER ]

[ INTER RUPT ]

[ MULT FCTN PERIPHERL ] [ MAIN RAM ]

[ CONTINUE ] [ Rtn ]

[ DIGITAL PROCESSOR ] [ ALL ]

[ Rtn ]

[ SOURCE ]

[ SOU RCE LO ]

[ SOURCE TO CPU ] [ CONTINUE ]

[ Rtn ]

[ ADC GATE ARRAY ] [ INPUTS ]

[ <F “Times”>Times"P10ALL ] [ CONTINUE< >]

[ Rtn ]

[ TACHOMETR ] [ CO NTINUE ]

A failure may cause the self tests to run very slow. If the analyzer does not complete a self test within a few minutes (analyzer locks up during the test), consider it equivalent to displaying FAILS in the test log.

•If any of these self tests fail, locate the test that failed in the ‘’Self-Test Troubleshooting Guide’’ on page 4-33.

•If the failure still is not isolated, go to page 4-45,‘’To troubleshoot source and calibrator failures.’’

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