Agilent Technologies 35670-90066 manual Source DC Offset, Source Flatness, Source Distortion

	Verifying Specifications			Agilent 35670A
	Performance Test Record - Two Channel
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
	Source DC Offset
	Measurement	Lower Limit	Upper Limit	Measured Value	Pass/Fail
		(mVdc)	(mVdc)	(mVdc)
	0 Vdc, 0 Vac(pk)	−15	15
	−10 Vdc, 0 Vac(pk)	−315	315
	+10 Vdc, 0 Vac(pk)	−315	315
	−5 Vdc, 5 Vac(pk)	−315	315
	+5 Vdc, 5 Vac(pk)	−315	315
	0 Vdc, 5 Vac(pk)	−165	165
	Source Flatness
	Measurement	Lower Limit	Upper Limit	Measured Value	Pass/Fail
		(dB)	(dB)	(dB)
	12.8 kHz	−1	1
	25.6 kHz	−1	1
	51.2 kHz	−1	1
	102.4 kHz	−1	1
	Source Distortion
	Measurement	Lower Limit	Upper Limit	Measured Value	Pass/Fail
			(dBc)	(dBc)
	12.8 kHz		−60
	51.2 kHz		−40
	102.4 kHz		−40

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