Agilent Technologies 35670-90066 manual Swept Sine Measurements -Option 1D2

Agilent 35670A	Specifications
	Swept Sine Measurements —Option 1D2

Swept Sine Measurements —Option 1D2

Dynamic range	130 dB typical
Default span: 51.2 Hz to 51.2 kHz
Fast average ON, 101 point log sweep
Tested with 11 dBVrms source level at 100 ms
integration (approximately 60 second sweep)

Arbitrary Waveform Source—Option 1D4

Amplitude Range	Arb: ±5 Vpk †
	dc: ±10 V †
	† Vpk +Vdc ≤10 V
Record Length	# of points = 2.56 x lines of resolution, or # of
Depends on measurement resolution (100,	complex points = 1.28 x lines of resolution
200, 400, 800, and 1600 lines)
Point spacing	Matches the measurement sample rate.
DAC Resolution
0.2828 Vpk to 5 Vpk	2.5 mV
<0.2828 Vpk	0.25 mV

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