Agilent 35670A

Internal Test Descriptions

 

Self-Test Descriptions

Self Test

GPIB Command

 

 

 

 

[ SELF TEST ]

 

[ FUNCTIONL TESTS ]

 

 

 

[ DIGITAL PROCESSOR ]

 

 

 

[ TRIGGER ]

TEST:DSP:TRIG; *WAI

 

 

 

[ LO ]

TEST:DSP:LO; *WAI

 

 

 

[ DIGITAL FILTER ]

TEST:DSP:FILT; *WAI

 

 

 

[ FIFO ]

TEST:DSP:FIFO; *WAI

 

 

 

[ BASEBAND ]

TEST:DSP:BAS; *WAI

 

 

 

[ ZOOM ]

TEST:DSP:ZOOM; *WAI

 

[ DGTL SRCE THRU DSP ]

TEST:DSP:SOUR; *WAI

 

 

 

[ ALL ]

TEST:DSP:ALL; *WAI

 

 

 

[ SOURCE ]

 

 

 

[ SOURCE LO ]

TEST:SOUR:LO; *WAI

 

 

 

[ SOURCE TO CPU ]

TEST:SOUR:CPU; *WAI

 

 

 

[ WITHOUT LO ]

TEST:SOUR:BAS; *WAI

 

 

 

[ WITH LO ]

TEST:SOUR:ZOOM; *WAI

 

 

 

[ ALL ]

TEST:SOUR:ALL; *WAI

 

[ INPUTS ]

 

 

 

[ OFFSET ]

TEST:INP:OFFS; *WAI

 

 

 

[ DISTORTN ]

TEST:INP:DIST; *WAI

 

 

 

[ INPUT TRIGGER ]

TEST:INP:TRIG; *WAI

 

 

 

[ INPUT A-WEIGHT ]

TEST:INP:AWE; *WAI

 

 

 

[ AAF BYPASS ]

TEST:INP:AAF; *WAI

 

[ INPUT ICP ]

TEST:INP:ICP; *WAI

 

 

 

[ ALL ]

TEST:INP:ALL; *WAI

 

[ TACHOMETR ]

TEST:TACH; *WAI

 

 

 

[ ADC GATE ARRAY ]

TEST:ADC:GARR; *WAI

 

 

 

[ OTHER ]

 

 

 

[ INTERRUPT ]

TEST:PROC:INT; *WAI

 

[ MULT FCTN PERIPHERL ]

TEST:PROC:MFP; *WAI

 

 

 

[ ALL ]

TEST:PROC:ALL; *WAI

 

 

 

[ ALL ]

TEST:ALL; *WAI

 

 

 

[ LOOP MODE ON/OFF ]

TEST:LOOP:MODE ONOFF

 

[ TEST LOG ]

DISP:CONT TTAB

 

 

 

[ CLEAR TEST LOG ]

TEST:LOG:CLE

 

 

 

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Agilent Technologies 35670-90066 manual Self Test Functionl Tests Digital Processor Trigger