Agilent Technologies 35670-90066 manual Functional Tests All Self-Test Group

Agilent 35670A	Internal Test Descriptions
	Self-Test Descriptions

Functional Tests All Self-Test Group

Assembly

Softkey

Self Test Name

A7

A8

A6

A12/

A1

A2

A5

A10

A11

A100

A22

[ INTERRUPT ]

Interrupt

X

0

[ MULTI FCTN PERIPHERL ]

†

Multi Fctn Peripheral

X

0

[ FRONT PANEL ]

†

Front Panel

X

0

X

[ GPIB FUNC TEST ]

GPIB

X

0

[ DISK CONTROLLR ]

Disk Controller

X

0

[ DISK FIFO ]

Disk FIFO

X

0

[ IIC BUS ]

IIC Bus

X

0

X

X

X

X

X

X

[ FAST BUS ]

†

Fast Bus

X

0

X

[ TRIGGER ]

Trigger Gate Array

0

0

X

[ LO ]

LO Gate Array

0

0

X

[ DIGITAL FILTER ]

Digital Filter Gate Array

0

0

X

[ FIFO ]

FIFO

0

0

X

[ BASEBAND ]

Baseband

0

0

X

X

X

X

[ ZOOM ]

Zoom

0

0

X

X

X

X

[ DGTL SRCE THRU DSP ]

Source through DSP

0

0

X

[ SOURCE LO ]

Source LO

0

0

X

[ SOURCE TO CPU ]

Source to CPU

0

0

X

[ WITHOUT LO ]

Source without LO

0

0

X

X

X

X

[ WITH LO ]

Source with LO

0

0

X

X

X

X

[ ADC GATE ARRAY ]

ADC Gate Array

0

0

0

X

[ OFFSET ]

Input Offset

0

0

0

X

X

X

[ DISTORTN ]

Input Distortion

0

0

0

X

X

X

[ INPUT TRIGGER ]

Input Trigger

0

0

0

X

X

X

[ INPUT A-WEIGHT ]

Input A-Wt Filter

0

0

0

X

X

X

[ AAF BYPASS ]

Input AAF/Bypass

0

0

0

X

X

X

[ INPUT ICP ]

Input ICP Source

0

0

0

X

X

X

[ TACHOMETR ]$!

Tachometer

0

0

X

0

X

C5,5,0,255,255,255

[ QUICK CONF TEST ]

Quick Confidence

0

0

0

X

X

X

X This assembly or sub-block is the most likely cause of the failure message.

0 This assembly or sub-block is used by the self test but is not the most likely cause of the

failure message. No symbol means that the assembly is not used by the self test.

† High-level power-on tests

The power supply and display are used in every test.

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