Agilent Technologies 35670-90066 Self-Test Menu Map and Gpib Commands, Self Test Gpib Command

Internal Test Descriptions	Agilent 35670A
Self-Test Descriptions

Self-Test Menu Map and GPIB Commands

The analyzer’s self tests can be run from the front panel or by a controller via GPIB. To run a test from the front panel, press [ System Utility ] followed by the appropriate softkey in the table. To run a test via GPIB, send the equivalent GPIB command (to abort a test, send TEST:ABOR).

To view the analyzer’s fault log via GPIB, send DISP:CONT FTAB. To clear the fault log send SYST:FLOG:CLE. To return to the top line of the test log and delete the line from the test log, send TEST:LOG:DATA:LINE?

The following table shows the softkeys and GPIB commands for each self test.

Self Test	GPIB Command
[ SELF TEST ]	–
[ QUICK CONF TEST ]	*TST?
[ LONG CONF TEST ]	TEST:LONG
[ FUNCTIONL TESTS ]	–
[ DISPLAY PATTERN ]	TEST:DISP:PATT ONOFF
[ I/O ]	–
[ FRONT PANEL ]	TEST:IO:FPAN; *WAI
[ GPIB ]	–
[ GPIB FUNC TEST ]	TEST:IO:GPIB; *WAI
[ GPIB CONNECTOR ]	–
[ INTERNAL DISK ]	–
[ DISK CONTROLLR ]	TEST:IO:DISK:CONT; *WAI
[ DISK FIFO ]	TEST:IO:DISK:FIFO; *WAI
[ RESTORE ]	TEST:IO:DISK:REST; *WAI
[ RANDOM SEEK ]	TEST:IO:DISK:RAND; *WAI
[ SEEK RECORD ]	TEST:IO:DISK:SEEK n; *WAI †
[ READ ]	TEST:IO:DISK:READ; *WAI
[ READ/WRITE ]	TEST:IO:DISK:WRIT; *WAI
[ READ/WRITE ALL ]	TEST:IO:DISK:RWR; *WAI
[ ALL ]	TEST:IO:DISK:ALL; *WAI
[ IIC BUS ]	TEST:IO:IIC; *WAI
[ FAST BUS ]	TEST:IO:FBUS; *WAI
[ SERIAL PORT ]	TEST:IO:SER; *WAI
[ ALL ]	TEST:IO:ALL; *WAI

† where n = 0 to [(tracks per side x sides x sectors per track) –1]

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