Contents
5-19. Test Setup for Time-Gated Spectrum Analyzer Capability . . 5-41 5-20. Setting the Center Frequency, Span, and Reference Level 5-43
5-21. Setting the Sweep Time . . . . . . . . . . . . . . . . . 5-44
5-22. Setting the Gate Delay and Gate Length Using an Oscilloscope 5-45
5-23. Using Time-Gating to View Signal 1 . . . . . . . . . . . . 5-47
5-24. Placing the Gate Output During the Second Signal . . . . . 5-48
5-25. Viewing Both Signals with Time-Gating . . . . . . . . . . 5-49 5-26. Gate Not Occurring During the Pulse . . . . . . . . . . . 5-50
5-27. Gate is Occurring at the Beginning of the Pulse . . . . . . . 5-51
5-28. Self-Calibration Data Results . . . . . . . . . . . . . . . 5-55 5-29. Rear Panel Connections for Time-Gated Spectrum Analyzer
Capability . . . . . . . . . . . . . . . . . . . . . . 5-56
5-30. Gate On . . . . . . . . . . . . . . . . . . . . . . . . 5-57
5-31. Using the Level Gate Control . . . . . . . . . . . . . . . 5-58
5-32. N dB Bandwidth Measurement . . . . . . . . . . . . . . 5-60
5-33. Percent Amplitude Modulation Measurement . . . . . . . . 5-62
5-34. Third-Order Intermodulation Measurement . . . . . . . . . 5-65
5-35. Occupied Bandwidth . . . . . . . . . . . . . . . . . . . 5-69
5-36. Adjacent Channel Power . . . . . . . . . . . . . . . . . 5-71
5-37. Adjacent Channel Power Extended . . . . . . . . . . . . 5-72
5-38. Adjacent Channel Power Graph . . . . . . . . . . . . . . 5-72
5-39. Channel Power . . . . . . . . . . . . . . . . . . . . . 5-75
5-40. Channel Power Graph . . . . . . . . . . . . . . . . . . 5-76
6-l. Memory Card Catalog Information . . . . . . . . . . . . . 6-27 6-2. Analyzer Memory Catalog Information . . . . . . . . . . . 6-29
6-3. CATALOG ON EVENT Display . . . . . . . . . . . . . . 6-33 6-4. Connecting a Printer to the analyzer . . . . . . . . . . . 6-48
