Hitachi S-4800 manual Foreword

	FOREWORD
APPLICATION	• The S-4800 SEM utilizes electron beam accelerated at 500 V to 30 kV.
	The instrument is designed mainly for observation and evaluation of
	specimens prepared for observation using SEM.
	• Note that Hitachi High-Technologies Corporation will not be responsible
	for injury or damage caused by usage of the instrument in a manner not
	described in this manual.
CAUTION	The electron microscope need not conform to the “Radiation Hazard
	Preventive Laws” or “Ionizing Radiation Hazard Preventive Regulations”
	currently in effect throughout the world, unlike the instruments
	designed to produce x-rays.
	The suggestion made by the ICRP (International Committee on Radiation
	Hazard Prevention), however, clearly defines that the electron
	microscope, like the home television set, will potentially produce a certain
	amount of x-rays as an undesirable byproduct. From a safety viewpoint,
	therefore, it is essential to operate the instrument carefully taking into
	account the following fundamental precautions.
	(1) Use the instrument within the application range specified in the
	catalog or instruction manual.
	(2) Do not operate the instrument with covers or doors removed, nor use
	alternatives for these components.
	(3) Do not apply modifications which may possibly result in deactivation
	of the built-in safety devices.
CAUTION	Viewing the screen of the computer monitor and/or operating the computer
	keyboard for prolonged, uninterrupted periods of time may result in fatigue
	or other problems such as eye strain or repetitive motion injuries.
	Therefore, Hitachi High-Technologies Corporation recommends that the
	user carefully consider these potential risks when establishing guidelines
	for proper use of this instrument in their workplace.

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