F610

 

F614

 

 

 

Low Current Trip

Direct Access Number —

F610

Program Protection Parameters Low Current Settings

Parameter Type — Check Box

This parameter Enables/Disables the low-current trip feature.

Factory Default — Disabled

 

Changeable During Run — No

When enabled, the drive will trip on a low-current fault if the output current of

 

 

the drive falls below the level defined at F611 and remains there for the time set

 

 

at F612.

 

 

Settings:

 

 

Disabled

 

 

Enabled (box checked)

 

 

 

 

 

Low Current Trip Threshold

Direct Access Number —

F611

Program Protection Parameters Low Current Settings

Parameter Type — Numerical

When the low-current monitor is enabled, this function sets the low-current trip

Factory Default — 0.00

 

Changeable During Run — Yes

threshold. The threshold value is entered as a percentage of the maximum rating

 

 

of the drive.

Minimum — 0.00

 

Maximum — 100.0

Units — %

Low Current Trip Threshold Time

Program Protection Parameters Low Current Settings

When the low-current monitor is enabled, this function sets the time that the low-current condition must exist to cause a trip.

Direct Access Number — F612

Parameter Type — Numerical

Factory Default — 0

Changeable During Run — Yes

Minimum — 0

Maximum — 255

Units — Seconds

Short Circuit Test

Direct Access Number — F613

Program Protection Parameters Arm Short Check Settings

Parameter Type — Selection List

This parameter determines when the system will perform an Output Short

Factory Default — Every Run

Changeable During Run — No

Circuit test.

 

Settings:

 

Every Run

 

Every Powerup

 

 

 

Short Circuit Test Duration

Direct Access Number — F614

Program Protection Parameters Arm Short Check Settings

Parameter Type — Numerical

This parameter sets the pulse width of the ASD output pulse that is applied to

Factory Default — (ASD-dependent)

Changeable During Run — No

the motor during an Output Short Circuit test.

 

 

Minimum — 1

 

Maximum — 100

 

Units — µS

156

G7 ASD Operation Manual

Page 162
Image 162
Toshiba G7 manual Low Current Trip Threshold Time, Short Circuit Test Duration